Detail publikace

Contribution to characterization of interdigital capacitors

Originální název

Contribution to characterization of interdigital capacitors

Anglický název

Contribution to characterization of interdigital capacitors

Jazyk

en

Originální abstrakt

This article deals with characterization of thick film interdigital capacitors, where attention is devoted to the influence of air gap width on capacitance. Air gap serves as dielectric and the scope of interest is dependence of the capacitance on air gap width.The set of interdigital capacitors was created with different air gap width.These capacitors were measured and result is evaluated in this article.

Anglický abstrakt

This article deals with characterization of thick film interdigital capacitors, where attention is devoted to the influence of air gap width on capacitance. Air gap serves as dielectric and the scope of interest is dependence of the capacitance on air gap width.The set of interdigital capacitors was created with different air gap width.These capacitors were measured and result is evaluated in this article.

Dokumenty

BibTex


@inproceedings{BUT73335,
  author="Jiří {Pulec} and Ivan {Szendiuch}",
  title="Contribution to characterization of interdigital capacitors",
  annote="This article deals with characterization of thick film interdigital capacitors, where attention is devoted to the influence of air gap width on capacitance. Air gap serves as dielectric and the scope of interest is dependence of the capacitance on air gap width.The set of interdigital capacitors was created with different air gap width.These capacitors were measured and result is evaluated in this article.",
  booktitle="ISSE 2011 Conference Proceedings",
  chapter="73335",
  howpublished="electronic, physical medium",
  year="2011",
  month="may",
  pages="50--52",
  type="conference paper"
}