Detail publikace

Artificial defects of solar cells

ŠKARVADA, P. TOMÁNEK, P. PALAI-DANY, T.

Originální název

Artificial defects of solar cells

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

Artificial defects of solar cells are observable with laser beam induced current techniques. Reversed bias solar cell light emission can also reveal structure inhomogenity and local mechanical damage of the sample. The paper shows simple method for basic classification into structure group and artificial defects group. Observed artificial defects are shown and process of its creation is described. Defects classification method is based on the measurement of light emission at fixed reverse voltage while the temperature of sample is changing in the range of 20 K. There is different light emission temperature dependence in the case of bulk defects and mechanical damage defects. Experimental light emission data are consequently correlated with laser beam induced current map.

Klíčová slova

solar cell, light emission, silicon, reverse biased

Autoři

ŠKARVADA, P.; TOMÁNEK, P.; PALAI-DANY, T.

Rok RIV

2011

Vydáno

27. 6. 2011

Nakladatel

ZČU

Místo

Plzeň

ISSN

1802-4564

Periodikum

ElectroScope - http://www.electroscope.zcu.cz

Ročník

2011

Číslo

2

Stát

Česká republika

Strany od

33

Strany do

37

Strany počet

5

BibTex

@article{BUT72917,
  author="Pavel {Škarvada} and Pavel {Tománek} and Tomáš {Palai-Dany}",
  title="Artificial defects of solar cells",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2011",
  volume="2011",
  number="2",
  pages="33--37",
  issn="1802-4564"
}