Detail publikace

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

SEDLÁKOVÁ, V. PAVELKA, J. ŠIKULA, J. ROČAK, D. HROVAT, M. BELAVIČ, D.

Originální název

Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The noise spectroscopy measurement and third harmonic testing of thick film layers are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between long term stability and current noise and third harmonic index was investigated.

Klíčová slova

noise

Autoři

SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D.

Rok RIV

2001

Vydáno

1. 1. 2001

Nakladatel

World Scientific

Místo

Gainesville, Florida, USA

ISBN

981-02-4677-3

Kniha

Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001

Strany od

747

Strany do

750

Strany počet

4

BibTex

@inproceedings{BUT6857,
  author="Vlasta {Sedláková} and Jan {Pavelka} and Josef {Šikula} and Dubravka {Ročak} and Marko {Hrovat} and Darko {Belavič}",
  title="Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators",
  booktitle="Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001",
  year="2001",
  pages="4",
  publisher="World Scientific",
  address="Gainesville, Florida, USA",
  isbn="981-02-4677-3"
}