Detail publikace

Gamma Ray Damage of Unbiased CCD Image Sensors

Z. Barton, R. Vrba

Originální název

Gamma Ray Damage of Unbiased CCD Image Sensors

Typ

konferenční sborník (ne článek)

Jazyk

angličtina

Originální abstrakt

High image quality Charge-coupled device (CCD) image sensors are needed in many applications. Low noise and high dynamic range are critical parameters required in scientific and industrial applications. In many of the applications, however, the CCD image sensor can be irradiated by a ionizing radiation, as alpha, beta, gamma or x-ray. This paper shows behaviour of low noise, high dynamic range, 1 Megapixel Frame-Transfer CCD FTT1010-M [1] image sensor radiated by gamma ray radiation. CCD image sensor driver board with rad-hard components was designed and used during the tests. Results of the investigation will be used in system for protein crystallization study in microgravity.

Klíčová slova

Gamma Ray, Damage, CCD Image Sensor, Unbiased

Autoři

Z. Barton, R. Vrba

Vydáno

1. 1. 2005

Nakladatel

ET2005

ISBN

954-438-518-5

Kniha

14th International Scientific and Applied Science Conference

Strany od

194

Strany do

198

Strany počet

5

BibTex

@proceedings{BUT64585,
  editor="Zdeněk {Bartoň} and Radimír {Vrba}",
  title="Gamma Ray Damage of Unbiased CCD Image Sensors",
  year="2005",
  pages="5",
  publisher="ET2005",
  isbn="954-438-518-5"
}