Detail publikace

Contribution to modeling of stressing in microelectronic structures

Originální název

Contribution to modeling of stressing in microelectronic structures

Anglický název

Contribution to modeling of stressing in microelectronic structures

Jazyk

en

Originální abstrakt

Topic of my article is modeling of thermomechanical stressing in modern microelectronic structures. Simulations are made using software ANSYS, which is based on Finite Element Method (FEM). Using this method, thermomechanical stressing in various structures was modeled. After simulations, data evaluation and comparison of yielded results was made to determine amplitudes and differences between stressing in various regions of modeled structure and between individual structures.

Anglický abstrakt

Topic of my article is modeling of thermomechanical stressing in modern microelectronic structures. Simulations are made using software ANSYS, which is based on Finite Element Method (FEM). Using this method, thermomechanical stressing in various structures was modeled. After simulations, data evaluation and comparison of yielded results was made to determine amplitudes and differences between stressing in various regions of modeled structure and between individual structures.

Dokumenty

BibTex 


@misc{BUT61078,
  author="Jiří {Pulec} and Ivan {Szendiuch}",
  title="Contribution to modeling of stressing in microelectronic structures",
  annote="Topic of my article is modeling of thermomechanical stressing in modern microelectronic structures. Simulations are made using software ANSYS, which is based on Finite Element Method (FEM). Using this method, thermomechanical stressing in various structures was modeled. After simulations, data evaluation and comparison of yielded results was made to determine amplitudes and differences between stressing in various regions of modeled structure and between individual structures.",
  address="Oficyna Wydawnicza Politechniki Warszawskiej",
  booktitle="Abstract proceedings. Polymer Electronics and Nanotechnologies: towards System Integration.",
  chapter="61078",
  institution="Oficyna Wydawnicza Politechniki Warszawskiej",
  year="2010",
  month="may",
  pages="218--219",
  publisher="Oficyna Wydawnicza Politechniki Warszawskiej",
  type="abstract"
}