Detail publikace

Two Level Testability System

KOTÁSEK, Z., STRNADEL, J., RŮŽIČKA, R., ZBOŘIL, F.

Originální název

Two Level Testability System

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Principles of two level testability analysis system will are described in the paper. The behavioural description of the unit under analysis (UUA) is the first level, on which the source VHDL file is taken as an input. On this level, the VHDL constructions which might cause testability problems in the resulting design are identified and the possibility of deriving i paths is evaluated. The RT level is the second level, on which the testability aspects are taken into account. For these purposes, the RT level structure is converted into a directed labelled graph which reflects the structure of the UUA and its diagnostic features which are important for the testability analysis. The analysis is done on the graph instead of on the VHDL source text.

Klíčová slova

RTL, Testability Analysis, VHDL

Autoři

KOTÁSEK, Z., STRNADEL, J., RŮŽIČKA, R., ZBOŘIL, F.

Rok RIV

2001

Vydáno

1. 1. 2001

Místo

Ostrava

ISBN

80-85988-57-7

Kniha

Proceedings of the 35th Spring International Conference MOSIS'01

Strany od

433

Strany do

440

Strany počet

8

BibTex

@inproceedings{BUT5604,
  author="Zdeněk {Kotásek} and Richard {Růžička} and Josef {Strnadel} and František {Zbořil}",
  title="Two Level Testability System",
  booktitle="Proceedings of the 35th Spring International Conference MOSIS'01",
  year="2001",
  pages="433--440",
  address="Ostrava",
  isbn="80-85988-57-7"
}