Detail publikace

Process Characterization and Description in Order to Reliability Assessment

NOVOTNÝ, R.

Originální název

Process Characterization and Description in Order to Reliability Assessment

Anglický název

Process Characterization and Description in Order to Reliability Assessment

Jazyk

en

Originální abstrakt

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Anglický abstrakt

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Dokumenty

BibTex


@article{BUT49207,
  author="Radovan {Novotný}",
  title="Process Characterization and Description in Order to Reliability Assessment",
  annote="This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.",
  address="Naun.org",
  chapter="49207",
  institution="Naun.org",
  journal="International Journal of Circuits Systems and Signal Processing",
  number="4",
  volume="2007",
  year="2008",
  month="january",
  pages="303--309",
  publisher="Naun.org",
  type="journal article - other"
}