Detail publikace
Process Characterization and Description in Order to Reliability Assessment
NOVOTNÝ, R.
Originální název
Process Characterization and Description in Order to Reliability Assessment
Anglický název
Process Characterization and Description in Order to Reliability Assessment
Jazyk
en
Originální abstrakt
This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.
Anglický abstrakt
This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.
Dokumenty
BibTex
@article{BUT49207,
author="Radovan {Novotný}",
title="Process Characterization and Description in Order to Reliability Assessment",
annote="This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.",
address="Naun.org",
chapter="49207",
institution="Naun.org",
journal="International Journal of Circuits Systems and Signal Processing",
number="4",
volume="2007",
year="2008",
month="january",
pages="303--309",
publisher="Naun.org",
type="journal article - other"
}