Detail publikace

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

GRMELA, L. MACKŮ, R. TOMÁNEK, P.

Originální název

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

A study of the electro-optical and aging characteristics of nanostructured and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0 wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied. Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well.

Klíčová slova

Electroluminescence, luminescence centers, nanocrystal, phosphors, photoluminescence, scanning near-field optical microscopy, ZnS:Mn

Autoři

GRMELA, L.; MACKŮ, R.; TOMÁNEK, P.

Rok RIV

2008

Vydáno

1. 2. 2008

Nakladatel

Blackwell Publishing

Místo

London

ISSN

0022-2720

Periodikum

Journal of Microscopy

Ročník

229

Číslo

2

Stát

Spojené království Velké Británie a Severního Irska

Strany od

275

Strany do

280

Strany počet

6

BibTex

@article{BUT44530,
  author="Lubomír {Grmela} and Robert {Macků} and Pavel {Tománek}",
  title="Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices",
  journal="Journal of Microscopy",
  year="2008",
  volume="229",
  number="2",
  pages="275--280",
  issn="0022-2720"
}