Detail publikace

Stress Testing in the Evaluation the Reliability of Electronic Devices

Originální název

Stress Testing in the Evaluation the Reliability of Electronic Devices

Anglický název

Stress Testing in the Evaluation the Reliability of Electronic Devices

Jazyk

en

Originální abstrakt

Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.

Anglický abstrakt

Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.

BibTex


@inproceedings{BUT3858,
  author="Radovan {Novotný}",
  title="Stress Testing in the Evaluation the Reliability of Electronic Devices",
  annote="Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.",
  address="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
  booktitle="Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings",
  chapter="3858",
  institution="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
  year="2001",
  month="january",
  pages="253",
  publisher="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
  type="conference paper"
}