Detail publikace

THE TEST AND MEASUREMENT DEVICES FOR HIGH VOLTAGE

KRBAL, M. BAXANT, P.

Originální název

THE TEST AND MEASUREMENT DEVICES FOR HIGH VOLTAGE

Český název

THE TEST AND MEASUREMENT DEVICES FOR HIGH VOLTAGE

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

cs

Originální abstrakt

High voltage presents a very perspective area of the power engineering. The test and measurement devices for high and very high voltages are typically located in a large measuring and testing laboratories. So their requirements for space and financial costs are huge. In my project, these devices are created on a small scale, but they are fully functional and it is possible to perform measurements as on a commercial devices. Of course, at lower voltage levels.

Český abstrakt

High voltage presents a very perspective area of the power engineering. The test and measurement devices for high and very high voltages are typically located in a large measuring and testing laboratories. So their requirements for space and financial costs are huge. In my project, these devices are created on a small scale, but they are fully functional and it is possible to perform measurements as on a commercial devices. Of course, at lower voltage levels.

Klíčová slova

High voltage, power engineering, laboratory, measurement device

Rok RIV

2011

Vydáno

02.05.2011

ISBN

978-80-214-4273-3

Kniha

Sborník prací konference a soutěže Student EEICT 2011

Strany od

1

Strany do

5

Strany počet

5

Dokumenty

BibTex


@inproceedings{BUT37184,
  author="Michal {Krbal} and Petr {Baxant}",
  title="THE TEST AND MEASUREMENT DEVICES FOR HIGH VOLTAGE",
  annote="High voltage presents a very perspective area of the power engineering. The test and measurement devices for high and very high voltages are typically located in a large measuring and testing laboratories. So their requirements for space and financial costs are huge. In my project, these devices are created on a small scale, but they are fully functional and it is possible to perform measurements as on a commercial devices. Of course, at lower voltage levels.",
  booktitle="Sborník prací konference a soutěže Student EEICT 2011",
  chapter="37184",
  howpublished="print",
  year="2011",
  month="may",
  pages="1--5",
  type="conference paper"
}