Detail publikace

Approximate Parametric Fault Diagnosis

Originální název

Approximate Parametric Fault Diagnosis

Anglický název

Approximate Parametric Fault Diagnosis

Jazyk

en

Originální abstrakt

The paper shows a procedure for testing large analog circuits or circuits with parasitic parameters via multi-frequency parametric fault diagnosis. To simplify and accelerate calculations the approximate symbolic analysis is used and unknown tested parameters are analyzed in separate frequency bands. Classification of unknown parameters into frequency bands is based on sensitivities. The proposed procedure is shown on parametric diagnosis of an EMI filter.

Anglický abstrakt

The paper shows a procedure for testing large analog circuits or circuits with parasitic parameters via multi-frequency parametric fault diagnosis. To simplify and accelerate calculations the approximate symbolic analysis is used and unknown tested parameters are analyzed in separate frequency bands. Classification of unknown parameters into frequency bands is based on sensitivities. The proposed procedure is shown on parametric diagnosis of an EMI filter.

BibTex


@inproceedings{BUT36842,
  author="Zdeněk {Kincl} and Zdeněk {Kolka}",
  title="Approximate Parametric Fault Diagnosis",
  annote="The paper shows a procedure for testing large analog circuits or circuits with parasitic parameters via multi-frequency parametric fault diagnosis. To simplify and accelerate calculations the approximate symbolic analysis is used and unknown tested parameters are analyzed in separate frequency bands. Classification of unknown parameters into frequency bands is based on sensitivities. The proposed procedure is shown on parametric diagnosis of an EMI filter.",
  address="Brno University of Technology",
  booktitle="Proc. of the 21st International Conference RADIOELEKTRONIKA 2011",
  chapter="36842",
  howpublished="print",
  institution="Brno University of Technology",
  year="2011",
  month="april",
  pages="199--202",
  publisher="Brno University of Technology",
  type="conference paper"
}