Detail publikace

Power side channel information measurement

MARTINÁSEK, Z. MÁCHA, T. ZEMAN, V.

Originální název

Power side channel information measurement

Anglický název

Power side channel information measurement

Jazyk

en

Originální abstrakt

This article describes the proper configuration of the experimental workplace, which is designed to obtain information leaking through the power side channel. The workplace is designed with reference to the distinct results and the cost of equipment. By the help of this workplace, we can distinguish between specific instructions and the number of switching transistors in the memory. Introduction deals with the reason of power changes at cryptographic devices. Other chapters describe the selection of appropriate measurement methods and measuring equipment. In conclusion, the results are presented and compared.

Anglický abstrakt

This article describes the proper configuration of the experimental workplace, which is designed to obtain information leaking through the power side channel. The workplace is designed with reference to the distinct results and the cost of equipment. By the help of this workplace, we can distinguish between specific instructions and the number of switching transistors in the memory. Introduction deals with the reason of power changes at cryptographic devices. Other chapters describe the selection of appropriate measurement methods and measuring equipment. In conclusion, the results are presented and compared.

Dokumenty

BibTex


@inproceedings{BUT34715,
  author="Zdeněk {Martinásek} and Tomáš {Mácha} and Václav {Zeman}",
  title="Power side channel information measurement",
  annote="This article describes the proper configuration of the experimental workplace, which is designed to obtain information leaking through the power side channel. The workplace is designed with reference to the distinct results  and the cost of equipment. By the help of this workplace, we can distinguish between specific instructions and the number of switching transistors in the memory. Introduction deals with the reason of power changes at cryptographic devices. Other chapters describe the selection of appropriate measurement methods and measuring equipment. In conclusion, the results are presented and compared.",
  booktitle="Research in telecommunication technologies RTT2010",
  chapter="34715",
  howpublished="print",
  year="2010",
  month="september",
  pages="1--5",
  type="conference paper"
}