Detail publikace

Physical Demonstration of Polymorphic Self-checking Circuits

Originální název

Physical Demonstration of Polymorphic Self-checking Circuits

Anglický název

Physical Demonstration of Polymorphic Self-checking Circuits

Jazyk

en

Originální abstrakt

Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.

Anglický abstrakt

Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.

BibTex


@inproceedings{BUT30488,
  author="Richard {Růžička} and Lukáš {Sekanina} and Roman {Prokop}",
  title="Physical Demonstration of Polymorphic Self-checking Circuits",
  annote="Polymorphic gates can be considered as a new reconfigurable technology capable of
integrating logic functions with sensing in a single compact structure.
Polymorphic gates whose logic function can be controlled by the level of the
power supply voltage (Vdd) represent a special class of polymorphic gates. A new
polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was
fabricated and utilized in a self-checking polymorphic adder. This paper presents
an experimental evaluation of this novel implementation.",
  address="IEEE Computer Society",
  booktitle="Proc. of the 14th IEEE Int. On-Line Testing Symposium",
  chapter="30488",
  edition="NEUVEDEN",
  howpublished="print",
  institution="IEEE Computer Society",
  year="2008",
  month="july",
  pages="31--36",
  publisher="IEEE Computer Society",
  type="conference paper"
}