Detail publikace

Extended electrical and thermal properties of single junction silicon solar cells

MACKŮ, R.

Originální název

Extended electrical and thermal properties of single junction silicon solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper reports an electrical measurement of the single junction solar cells based on silicon technology. Defects of these samples are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measurements at very low temperatures are presented in this paper. Used types of solar cells differ above all in the surface texturing and dopand concentration. The cryogenic system is used to accurate setting of temperature with wide range of operating temperatures. The microscopic study of the samples surface is presented, too.

Klíčová slova

Solar cell, noise, breakdown, PN junction, transport mechanisms

Autoři

MACKŮ, R.

Rok RIV

2009

Vydáno

10. 4. 2009

Nakladatel

VUT v Brně

Místo

Brno

ISBN

978-80-214-3869-9

Kniha

Proceedings of the 15th conference Student EEICT 2009

Číslo edice

1

Strany od

208

Strany do

212

Strany počet

5

BibTex

@inproceedings{BUT29146,
  author="Robert {Macků}",
  title="Extended electrical and thermal properties of single junction silicon solar cells",
  booktitle="Proceedings of the 15th conference Student EEICT 2009",
  year="2009",
  number="1",
  pages="208--212",
  publisher="VUT v Brně",
  address="Brno",
  isbn="978-80-214-3869-9"
}