Detail publikace
Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates
SEKANINA, L.
Originální název
Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates
Anglický název
Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates
Jazyk
en
Originální abstrakt
TBD
Anglický abstrakt
TBD
Dokumenty
BibTex
@inproceedings{BUT28586,
author="Lukáš {Sekanina}",
title="Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates",
annote="TBD",
address="IEEE Computer Society",
booktitle="2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems",
chapter="28586",
howpublished="print",
institution="IEEE Computer Society",
year="2007",
month="april",
pages="243--246",
publisher="IEEE Computer Society",
type="conference paper"
}