Detail publikace

Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates

Originální název

Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates

Anglický název

Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates

Jazyk

en

Originální abstrakt

TBD

Anglický abstrakt

TBD

BibTex


@inproceedings{BUT28586,
  author="Lukáš {Sekanina}",
  title="Design and Analysis of a New Self-Testing Adder Which Utilizes Polymorphic Gates",
  annote="TBD",
  address="IEEE Computer Society",
  booktitle="2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems",
  chapter="28586",
  howpublished="print",
  institution="IEEE Computer Society",
  year="2007",
  month="april",
  pages="243--246",
  publisher="IEEE Computer Society",
  type="conference paper"
}