Detail publikace

PC controled equipment for FAST TRANSIENTS TESTING OF SILICON SOLAR CELLS

BOUŠEK, J.

Originální název

PC controled equipment for FAST TRANSIENTS TESTING OF SILICON SOLAR CELLS

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A simple method using fast transients has been suggested and demonstrated for the set of different quality photovoltaic cells. New approach uses PC controlled equipment. Cells parameters as the reverse breakdown voltage, depletion layer width and junction capacitance, serial and parallel resistance and lifetime of minority carriers in bulk can be taken easily. To suppress the influence of the depletion layer capacitance voltage bias was set by the dark current excitation.

Klíčová slova

crystalline silicon solar cells, minority carrier lifetime, breakdown voltage

Autoři

BOUŠEK, J.

Rok RIV

2007

Vydáno

20. 9. 2007

Nakladatel

nakl. Ing. Zdeněk Novotný, Brno

ISBN

978-80-214-3470-7

Kniha

Electronic Devices and Systems, EDS´07 PROCEEDINGS 2

Číslo edice

2

Strany od

415

Strany do

420

Strany počet

6

BibTex

@inproceedings{BUT28210,
  author="Jaroslav {Boušek}",
  title="PC controled equipment for FAST TRANSIENTS TESTING OF SILICON SOLAR CELLS",
  booktitle="Electronic Devices and Systems, EDS´07 PROCEEDINGS 2",
  year="2007",
  number="2",
  pages="415--420",
  publisher="nakl. Ing. Zdeněk Novotný, Brno",
  isbn="978-80-214-3470-7"
}