Detail publikace

Study of Noise Current in Large Area PN Junctions Measurement

Originální název

Study of Noise Current in Large Area PN Junctions Measurement

Anglický název

Study of Noise Current in Large Area PN Junctions Measurement

Jazyk

en

Originální abstrakt

This work deals with study of noise current in reverse biased PN junctions. When a high electric field is applied to a PN junction with some technological imperfections it produces tiny areas which could lead to deterioration in quality or destruction of the PN junction. Two fundamental types of the current noise have been detected during our noise waveform studies. The A-type noise is formed by a train of random-duration, random-time-separation, rectangular current impulses provided that a constant-voltage power supply is used. This type of noise is encountered mainly in small-area junction devices. The B-type noise is playing a predominate role in devices whose junction area exceeds 1 cm2, e. g. large area solar cells.

Anglický abstrakt

This work deals with study of noise current in reverse biased PN junctions. When a high electric field is applied to a PN junction with some technological imperfections it produces tiny areas which could lead to deterioration in quality or destruction of the PN junction. Two fundamental types of the current noise have been detected during our noise waveform studies. The A-type noise is formed by a train of random-duration, random-time-separation, rectangular current impulses provided that a constant-voltage power supply is used. This type of noise is encountered mainly in small-area junction devices. The B-type noise is playing a predominate role in devices whose junction area exceeds 1 cm2, e. g. large area solar cells.

BibTex


@inproceedings{BUT25278,
  author="Petr {Sadovský} and Pavel {Koktavý}",
  title="Study of Noise Current in Large Area PN Junctions Measurement",
  annote="This work deals with study of noise current in reverse biased PN junctions. When a high electric field is applied to a PN junction with some technological imperfections it produces tiny areas which could lead to deterioration in quality or destruction of the PN junction. Two fundamental types of the current noise have been detected during our noise waveform studies. The A-type noise is formed by a train of random-duration, random-time-separation, rectangular current impulses provided that a constant-voltage power supply is used. This type of noise is encountered mainly in small-area junction devices. The B-type noise is playing a predominate role in devices whose junction area exceeds 1 cm2, e. g. large area solar cells.",
  address="Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno",
  booktitle="New Trends in Physics",
  chapter="25278",
  edition="1",
  institution="Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno",
  year="2007",
  month="november",
  pages="126--129",
  publisher="Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno",
  type="conference paper"
}