Detail publikace

Advanced tunable protective structure against electrostatic discharge

Originální název

Advanced tunable protective structure against electrostatic discharge

Anglický název

Advanced tunable protective structure against electrostatic discharge

Jazyk

en

Originální abstrakt

New advanced SCR (silicon controlled rectifier) structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by TCAD systems. Then can be uniquely determined which features will be given by certain dimensions setting.For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.

Anglický abstrakt

New advanced SCR (silicon controlled rectifier) structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by TCAD systems. Then can be uniquely determined which features will be given by certain dimensions setting.For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.

BibTex


@inproceedings{BUT23809,
  author="Petr {Běťák} and Kamil {Nováček}",
  title="Advanced tunable protective structure against electrostatic discharge",
  annote="New advanced SCR (silicon controlled rectifier) structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by TCAD systems. Then can be uniquely determined which features will be given by certain dimensions setting.For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.",
  booktitle="ISSE 2007 30th International Spring Seminar on Electronics Technology 2007",
  chapter="23809",
  year="2007",
  month="january",
  pages="238",
  type="conference paper"
}