Detail publikace

TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT

PAVLÍK, M. MAGÁT, M. VRBA, R.

Originální název

TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with a design, construction and programming equipment of the tips workplace for chip characteristics measurement. Reason, why the experimental tips workplace of wafer probe was built, is to improve existing laboratory task for education. In the laboratory task the Hall voltage generation on silicon chip placed in the magnetic field was measured. However, new possibilities of use of the tips workplace were revealed

Klíčová slova

tips, measurement, silicon chip

Autoři

PAVLÍK, M.; MAGÁT, M.; VRBA, R.

Rok RIV

2007

Vydáno

12. 8. 2007

Nakladatel

University of Miskolc, Innovation and Technology Transfer Centre

Místo

Miskolc

ISBN

978-963-661-779-0

Kniha

6th International conference of PhD students

Číslo edice

první

Strany od

343

Strany do

347

Strany počet

5

BibTex

@inproceedings{BUT23389,
  author="Michal {Pavlík} and Martin {Magát} and Radimír {Vrba}",
  title="TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT",
  booktitle="6th International conference of PhD students",
  year="2007",
  number="první",
  pages="343--347",
  publisher="University of Miskolc, Innovation and Technology Transfer Centre",
  address="Miskolc",
  isbn="978-963-661-779-0"
}