Detail publikace

Investigation of 1/f Noise of p-type CdTe Detectors

ANDREEV, A. GRMELA, L.

Originální název

Investigation of 1/f Noise of p-type CdTe Detectors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper presents the results of experimental studies of transport and noise characteristics of CdTe single crystals. Though no universal mechanism has been identified for flicker noise or 1/f noise, it is the most ubiquitous form of noise in nature. Phenomena that have no obvious connection like heartbeat, cell membrane potential, financial data, DNA sequences and transistors exhibit fluctuations with a 1/f character. As the term "1/f" suggests, a spectral density that increases without limit as frequency decreases, characterizes this kind of noise. Flicker noise in the CdTe single crystals was studied. Two CdTe detectors were used; both have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D).

Klíčová slova

1/f noise; Hooge constant

Autoři

ANDREEV, A.; GRMELA, L.

Rok RIV

2007

Vydáno

1. 5. 2007

Nakladatel

Dan Pitica

Místo

Cluj-Napoca, Romania

ISBN

978-973-713-174-4

Kniha

30th International Spring Seminar on Electronics Technology 2007

Edice

MEDIAMIRA

Číslo edice

1

Strany od

88

Strany do

89

Strany počet

2

BibTex

@inproceedings{BUT23289,
  author="Alexey {Andreev} and Lubomír {Grmela}",
  title="Investigation of 1/f Noise of p-type CdTe Detectors",
  booktitle="30th International Spring Seminar on Electronics Technology 2007",
  year="2007",
  series="MEDIAMIRA",
  number="1",
  pages="88--89",
  publisher="Dan Pitica",
  address="Cluj-Napoca, Romania",
  isbn="978-973-713-174-4"
}