Detail publikace

Microplasma Noise - Coefficients of Generation and Recombination

RAŠKA, M. HOLCMAN, V.

Originální název

Microplasma Noise - Coefficients of Generation and Recombination

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns may exhibit as a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and pulse origin time points. The current impulse noise is dependent on voltage. When the reverse voltage on PN junction increases, frequency and width of impulses are also increasing. The microplasma bistable behaviour may be described with two-state stochastic process of generation-recombination type.

Klíčová slova

mikroplazma

Autoři

RAŠKA, M.; HOLCMAN, V.

Rok RIV

2007

Vydáno

1. 1. 2007

Nakladatel

Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno

Místo

Brno

ISBN

978-80-214-3409-7

Kniha

Student EEICT 2007

Edice

3

Číslo edice

1

Strany od

356

Strany do

360

Strany počet

4

BibTex

@inproceedings{BUT22993,
  author="Michal {Raška} and Vladimír {Holcman}",
  title="Microplasma Noise - Coefficients of Generation and Recombination",
  booktitle="Student EEICT 2007",
  year="2007",
  series="3",
  number="1",
  pages="356--360",
  publisher="Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno",
  address="Brno",
  isbn="978-80-214-3409-7"
}