Detail publikace

Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties

PEČENKA, T., KOTÁSEK, Z., SEKANINA, L., STRNADEL, J.

Originální název

Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper describes the utilization of evolutionary algorithms for automatic discovery of benchmark circuits. The main objective of the paper is to show that relatively large and complex (benchmark) circuits can be evolved in case that only a given property (e.g. testability) is required and the function of the circuit is not considered. This principle is demonstrated on automatic discovery of benchmark circuits with predefined structural and diagnostic properties. Fitness evaluation for the proposed algorithm is based on testability analysis with linear time complexity. During the evolution, the solutions which are refused to be synthesized by a design system are excluded from the process of developing a new generation of benchmark circuits. The evolved circuits contain thousands of components and satisfy the required testability properties.

Klíčová slova

evolutionary design, digital circuit, testability analysis, VHDL

Autoři

PEČENKA, T., KOTÁSEK, Z., SEKANINA, L., STRNADEL, J.

Rok RIV

2005

Vydáno

8. 7. 2005

Nakladatel

IEEE Computer Society Press

Místo

Los Alamitos

ISBN

0-7695-2399-4

Kniha

Proc. of the 2005 NASA/DoD Conference on Evolvable Hardware

Strany od

51

Strany do

58

Strany počet

8

URL

BibTex

@inproceedings{BUT21515,
  author="Tomáš {Pečenka} and Zdeněk {Kotásek} and Lukáš {Sekanina} and Josef {Strnadel}",
  title="Automatic Discovery of RTL Benchmark Circuits with Predefined Testability Properties",
  booktitle="Proc. of the 2005 NASA/DoD Conference on Evolvable Hardware",
  year="2005",
  pages="51--58",
  publisher="IEEE Computer Society Press",
  address="Los Alamitos",
  isbn="0-7695-2399-4",
  url="http://www.fit.vutbr.cz/~sekanina/publ/eh05/eh05bench.pdf"
}