Detail publikace

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

BOUREAU, V. STAŇO, M. Rouvière, J.-L. Toussaint, J.-C. Fruchart, O. Cooper, D

Originální název

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowire has been measured and compared to micromagnetic modeling. State-of-the-art off-axis electron holography has been performed using the averaging of large series of holograms to improve the sensitivity of the measurements. These results are then compared to those obtained from pixelated differential phase contrast, a technique that belongs to pixelated (or 4D) scanning transmission electron microscopy (STEM) experiments. This emerging technique uses a pixelated detector to image the local diffraction patterns as the beam is scanned over the sample. For each diffraction pattern, the deflection of the beam is measured and converted into magnetic induction, while scanning the beam allows a map to be generated. Aberration corrected Lorentz (field-free) configurations of the TEM and STEM were used for an improved spatial resolution. We show that the pixelated STEM approach, even when performed using an old generation of charge-coupled device camera, provides better sensitivity at the expense of spatial resolution. A more general comparison of the two quantitative techniques is given.

Klíčová slova

electron holography; pixelated DPC; 4D-STEM; pixelated STEM; magnetic induction; electric field; Lorentz microscopy; magnetic nanowire

Autoři

BOUREAU, V.; STAŇO, M.; Rouvière, J.-L.; Toussaint, J.-C.; Fruchart, O.; Cooper, D

Vydáno

25. 2. 2021

Nakladatel

IOP PUBLISHING LTD

ISSN

1361-6463

Periodikum

Journal of Physics D - Applied Physics

Ročník

54

Číslo

8

Stát

Spojené království Velké Británie a Severního Irska

Strany od

1

Strany do

11

Strany počet

11

URL

https://iopscience.iop.org/article/10.1088/1361-6463/abc77d

BibTex

@article{BUT167401,
  author="BOUREAU, V. and STAŇO, M. and Rouvière, J.-L. and Toussaint, J.-C. and Fruchart, O. and Cooper, D",
  title="High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast",
  journal="Journal of Physics D - Applied Physics",
  year="2021",
  volume="54",
  number="8",
  pages="1--11",
  doi="10.1088/1361-6463/abc77d",
  issn="1361-6463",
  url="https://iopscience.iop.org/article/10.1088/1361-6463/abc77d"
}

Dokumenty

2008.09308.pdf