Detail publikace

MATLAB-Based PHY Simulators for Performance Study of the IEEE 802.11ah/af Systems

POLÁK, L. JURÁK, P. MILOŠ, J.

Originální název

MATLAB-Based PHY Simulators for Performance Study of the IEEE 802.11ah/af Systems

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In the last decade, in order to realize reliable wireless communication link in a wide range of radio-frequency (RF) spectrum, the group of IEEE 802.11 technologies has been significantly expanded. In this paper, attention is devoted to the IEEE 802.11ah/af systems developed for Wireless Fidelity (Wi-Fi) based communication with a support of the Internet-of-Things (IoT) concept in the sub-1GHz bands. Two MATLAB-based simulators are introduced to explore basic features of both systems on physical (PHY) layer level. A simple performance study of both systems under different channel conditions, evaluated in terms of bit and modulation error ratio (BER and MER), is provided to validate the simulators. The single-input single-output and multiple-input multiple-output (SISO and MIMO) technologies are also briefly compared. Simulation results show that systems IEEE 802.11ah and IEEE.802.11af can complement each other in various transmission scenarios and use cases.

Klíčová slova

Wi-Fi, IEEE 802.11ah/af, PHY level simulator, 5G, IoT, M2M, SISO, MIMO, fading channel models

Autoři

POLÁK, L.; JURÁK, P.; MILOŠ, J.

Vydáno

7. 7. 2020

Místo

Milan (Italy)

ISBN

978-1-7281-6376-5

Kniha

2020 43rd International Conference on Telecommunications and Signal Processing (TSP)

Strany od

184

Strany do

187

Strany počet

4

URL

BibTex

@inproceedings{BUT165778,
  author="Ladislav {Polák} and Petr {Jurák} and Jiří {Miloš}",
  title="MATLAB-Based PHY Simulators for Performance Study of the IEEE 802.11ah/af Systems",
  booktitle="2020 43rd International Conference on Telecommunications and Signal Processing (TSP)",
  year="2020",
  pages="184--187",
  address="Milan (Italy)",
  doi="10.1109/TSP49548.2020.9163438",
  isbn="978-1-7281-6376-5",
  url="https://ieeexplore.ieee.org/abstract/document/9163438"
}