Detail publikace

Advanced structural analysis of silicon solar cells

PAPEŽ, N.

Originální název

Advanced structural analysis of silicon solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam-induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure analysis.

Klíčová slova

SEM, EBIC, optical microscopy, solar cells, defects

Autoři

PAPEŽ, N.

Vydáno

25. 4. 2019

Místo

Brno

ISBN

978-80-214-5735-5

Kniha

Proceedings of the 25th Conference STUDENT EEICT 2019

Číslo edice

1

Strany od

723

Strany do

727

Strany počet

5

URL

http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf

BibTex

@inproceedings{BUT158022,
  author="Nikola {Papež}",
  title="Advanced structural analysis of silicon solar cells",
  booktitle="Proceedings of the 25th Conference STUDENT EEICT 2019",
  year="2019",
  number="1",
  pages="723--727",
  address="Brno",
  isbn="978-80-214-5735-5",
  url="http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf"
}