Detail publikace

Reduction of metal artefacts in CT data with submicron resolution using dual-target CT

VÍTEČEK, J. ŠALPLACHTA, J.

Originální název

Reduction of metal artefacts in CT data with submicron resolution using dual-target CT

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The article deals with the possibility of the metal artefact reduction in computed tomography (CT) data with submicron resolution using dual-target CT. The sample is scanned twice at different acquisition parameters, at two different energy spectra. Dual-energy data are then used for easier localisation and segmentation of metal areas and the final combination of low and high-density materials. The final images are compared with the projection-based metal artefact reduction (MAR) algorithm and the commercial program VGStudio MAX 3.1. The results show good functionality of the proposed method and potential for further development.

Klíčová slova

X-ray computed tomography, Nanotomography, Submicron resolution, CT images artefacts, Reduction of metal artefacts, Dual-Target CT

Autoři

VÍTEČEK, J.; ŠALPLACHTA, J.

Vydáno

25. 4. 2019

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-5735-5

Kniha

Proceedings of the 25th Conference STUDENT EEICT 2019

Číslo edice

první

Strany od

394

Strany do

397

Strany počet

4

URL

http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf

BibTex

@inproceedings{BUT156889,
  author="Jiří {Víteček} and Jakub {Šalplachta}",
  title="Reduction of metal artefacts in CT data with submicron resolution using dual-target CT",
  booktitle="Proceedings of the 25th Conference STUDENT EEICT 2019",
  year="2019",
  number="první",
  pages="394--397",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-5735-5",
  url="http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf"
}