Detail publikace

On-chip nonlinear capacitor characterization

Originální název

On-chip nonlinear capacitor characterization

Anglický název

On-chip nonlinear capacitor characterization

Jazyk

en

Originální abstrakt

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

Anglický abstrakt

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

BibTex


@inproceedings{BUT15597,
  author="Tomáš {Sutorý} and Zdeněk {Kolka}",
  title="On-chip nonlinear capacitor characterization",
  annote="The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.",
  booktitle="Proceedings of the fourteenth International Electrotechnical and Computer Science Conference ERK 2005",
  chapter="15597",
  journal="Proceedings of the thirteenth International Electrotechnical and Computer Science Conference ERK 2004.",
  year="2005",
  month="january",
  pages="107",
  type="conference paper"
}