Detail publikace

Noise utilization in ADC linearity testing

Originální název

Noise utilization in ADC linearity testing

Anglický název

Noise utilization in ADC linearity testing

Jazyk

en

Originální abstrakt

This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and simulations supporting the effectiveness of the proposed method.

Anglický abstrakt

This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and simulations supporting the effectiveness of the proposed method.

BibTex


@inproceedings{BUT15550,
  author="Ondřej {Sajdl} and Radimír {Vrba}",
  title="Noise utilization in ADC linearity testing",
  annote="This paper presents the linearity characterization of an analog-to-digital converter
(ADC). The input signal is noise, which allows low analog area overhead for built-in
self-test (BIST). The linearity error estimation is proposed based on the spectral
analysis of only the output of the converter. This paper presents the underlying
theory and simulations supporting the effectiveness of the proposed method.",
  address="Vysoké učení technické v Brně",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  chapter="15550",
  institution="Vysoké učení technické v Brně",
  year="2005",
  month="october",
  pages="76",
  publisher="Vysoké učení technické v Brně",
  type="conference paper"
}