Detail publikace

Methods for Integrated Capacitors Characterization

Originální název

Methods for Integrated Capacitors Characterization

Anglický název

Methods for Integrated Capacitors Characterization

Jazyk

en

Originální abstrakt

This paper deals with techniques for capacitance characterization of integrated capacitors on a chip. Several methods are compared and a new method for non-linear capacitor characterization is proposed. It can measure the whole nonlinear characteristic in both polarities without necessity to switch the measured object.

Anglický abstrakt

This paper deals with techniques for capacitance characterization of integrated capacitors on a chip. Several methods are compared and a new method for non-linear capacitor characterization is proposed. It can measure the whole nonlinear characteristic in both polarities without necessity to switch the measured object.

BibTex


@inproceedings{BUT14757,
  author="Tomáš {Sutorý}",
  title="Methods for Integrated Capacitors Characterization",
  annote="This paper deals with techniques for capacitance characterization of integrated capacitors on a chip. Several methods are compared and a new method for non-linear capacitor characterization is proposed. It can measure the whole nonlinear characteristic in both polarities without necessity to switch the measured object.",
  address="The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic",
  booktitle="Proceedings of the15th International Czech - Slovak Scientific Conference RADIOELEKTRONIKA 2005",
  chapter="14757",
  institution="The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic",
  year="2005",
  month="may",
  pages="452",
  publisher="The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic",
  type="conference paper"
}