Detail publikace

Methods for Integrated Capacitors Characterization

SUTORÝ, T.

Originální název

Methods for Integrated Capacitors Characterization

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with techniques for capacitance characterization of integrated capacitors on a chip. Several methods are compared and a new method for non-linear capacitor characterization is proposed. It can measure the whole nonlinear characteristic in both polarities without necessity to switch the measured object.

Klíčová slova v angličtině

capacitance characterization, integrated capacitors, non-linear capacitor

Autoři

SUTORÝ, T.

Rok RIV

2005

Vydáno

3. 5. 2005

Nakladatel

The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic

Místo

Brno

ISBN

80-214-2904-6

Kniha

Proceedings of the15th International Czech - Slovak Scientific Conference RADIOELEKTRONIKA 2005

Strany od

452

Strany do

455

Strany počet

4

BibTex

@inproceedings{BUT14757,
  author="Tomáš {Sutorý}",
  title="Methods for Integrated Capacitors Characterization",
  booktitle="Proceedings of the15th International Czech - Slovak Scientific Conference RADIOELEKTRONIKA 2005",
  year="2005",
  pages="4",
  publisher="The Institute of Radio Electronics, Brno University of Technology, Purkyňova 118, 612 00 Brno, Czech Republic",
  address="Brno",
  isbn="80-214-2904-6"
}