Detail publikace

Single Measurement Determination of Mechanical, Electrical, and Surface Properties of a Single Carbon Nanotube via Force Microscopy

Originální název

Single Measurement Determination of Mechanical, Electrical, and Surface Properties of a Single Carbon Nanotube via Force Microscopy

Anglický název

Single Measurement Determination of Mechanical, Electrical, and Surface Properties of a Single Carbon Nanotube via Force Microscopy

Jazyk

en

Originální abstrakt

Carbon nanotubes (CNTs) have attracted significant attention due to their remarkable mechanical and electrical properties. Although it is assumed that the most important questions about CNTs have been addressed, the opposite is true. CNTs have high mechanical stiffness and electrical conductivity and, due to their small diameter and size, the measurement of those properties at nanoscale level is challenging. Here, we present a unique method to determine their mechanical and electrical properties by using interactions between vertically aligned multiwall CNTs and a metal-coated tipless atomic force microscope cantilever. We used a force–distance measurement (FDM) method with concurrent monitoring of electrical current. We could identify the number of CNTs in contact with the cantilever, stiffness of each individual CNT, the adhesion force between the cantilever and individual CNTs, and the electrical conductivity of each CNT. The method is also suitable for characterizing other vertically aligned nanostructured materials, such as nanowires. This method addresses the long-standing problem of property determination of materials such as CNTs and nanowires and is an important addition to the toolbox of nanoscale characterization methods.

Anglický abstrakt

Carbon nanotubes (CNTs) have attracted significant attention due to their remarkable mechanical and electrical properties. Although it is assumed that the most important questions about CNTs have been addressed, the opposite is true. CNTs have high mechanical stiffness and electrical conductivity and, due to their small diameter and size, the measurement of those properties at nanoscale level is challenging. Here, we present a unique method to determine their mechanical and electrical properties by using interactions between vertically aligned multiwall CNTs and a metal-coated tipless atomic force microscope cantilever. We used a force–distance measurement (FDM) method with concurrent monitoring of electrical current. We could identify the number of CNTs in contact with the cantilever, stiffness of each individual CNT, the adhesion force between the cantilever and individual CNTs, and the electrical conductivity of each CNT. The method is also suitable for characterizing other vertically aligned nanostructured materials, such as nanowires. This method addresses the long-standing problem of property determination of materials such as CNTs and nanowires and is an important addition to the toolbox of nanoscale characterization methods.

BibTex


@article{BUT145260,
  author="Vojtěch {Svatoš} and Radek {Kalousek} and Imrich {Gablech} and Jan {Pekárek} and Pavel {Neužil}",
  title="Single Measurement Determination of Mechanical, Electrical, and Surface Properties of a Single Carbon Nanotube via Force Microscopy",
  annote="Carbon nanotubes (CNTs) have attracted significant attention due to their remarkable mechanical and electrical properties. Although it is assumed that the most important questions about CNTs have been addressed, the opposite is true. CNTs have high mechanical stiffness and electrical conductivity and, due to their small diameter and size, the measurement of those properties at nanoscale level is challenging. Here, we present a unique method to determine their mechanical and electrical properties by using interactions between vertically aligned multiwall CNTs and a metal-coated tipless atomic force microscope cantilever. We used a force–distance measurement (FDM) method with concurrent monitoring of electrical current. We could identify the number of CNTs in contact with the cantilever, stiffness of each individual CNT, the adhesion force between the cantilever and individual CNTs, and the electrical conductivity of each CNT. The method is also suitable for characterizing other vertically aligned nanostructured materials, such as nanowires. This method addresses the long-standing problem of property determination of materials such as CNTs and nanowires and is an important addition to the toolbox of nanoscale characterization methods.",
  address="ELSEVIER SCIENCE SA",
  chapter="145260",
  doi="10.1016/j.sna.2018.01.014",
  howpublished="online",
  institution="ELSEVIER SCIENCE SA",
  number="NA",
  volume="271",
  year="2018",
  month="march",
  pages="217--222",
  publisher="ELSEVIER SCIENCE SA",
  type="journal article"
}