Detail publikace

Low frequecy in submicron MOSFET

Originální název

Low frequecy in submicron MOSFET

Anglický název

Low frequecy in submicron MOSFET

Jazyk

en

Originální abstrakt

This work discusses about Low-Frequenci Noise in the Metal-Oxide Semiconductor (MOS) system. Is describe the current-voltage and noise characteristic of an ultrahin oxide capacitor. In the concluding chapter is describe Impact of gate oxide breakdown on the noise of MOSFETs

Anglický abstrakt

This work discusses about Low-Frequenci Noise in the Metal-Oxide Semiconductor (MOS) system. Is describe the current-voltage and noise characteristic of an ultrahin oxide capacitor. In the concluding chapter is describe Impact of gate oxide breakdown on the noise of MOSFETs

BibTex


@inproceedings{BUT14369,
  author="Martin {Bláha}",
  title="Low frequecy in submicron MOSFET",
  annote="This work discusses about Low-Frequenci Noise in the Metal-Oxide Semiconductor (MOS) system. Is describe  the current-voltage and noise characteristic of an ultrahin oxide capacitor. In the concluding chapter is describe Impact of gate oxide breakdown on the noise of MOSFETs",
  booktitle="Student EEICT 2005",
  chapter="14369",
  year="2005",
  month="april",
  pages="198",
  type="conference paper"
}