Detail publikace

The Test Controller Model Based on The Timed Automaton

Originální název

The Test Controller Model Based on The Timed Automaton

Anglický název

The Test Controller Model Based on The Timed Automaton

Jazyk

en

Originální abstrakt

In the paper the process of the test controller model design and synthesis on Register Transfer Level (RTL) is described. The principles of test application to circuit element by the test controller model is discussed. The problem of I-path is explained. The formal tool - the timed automaton - is used as a suitable tool for test controller model. In the end of paper there is a simple example of timed automaton, which represents a model of particular behavior of the test controller.

Anglický abstrakt

In the paper the process of the test controller model design and synthesis on Register Transfer Level (RTL) is described. The principles of test application to circuit element by the test controller model is discussed. The problem of I-path is explained. The formal tool - the timed automaton - is used as a suitable tool for test controller model. In the end of paper there is a simple example of timed automaton, which represents a model of particular behavior of the test controller.

BibTex


@inproceedings{BUT13967,
  author="Daniel {Mika} and Zdeněk {Kotásek}",
  title="The Test Controller Model Based on The Timed Automaton",
  annote="In the paper the process of the test controller model design and
synthesis on Register Transfer Level (RTL) is described. The principles
of test application to circuit element by the test controller model is
discussed. The problem of I-path is explained. The formal tool - the
timed automaton - is used as a suitable tool for test controller model.
In the end of paper there is a simple example of timed automaton, which
represents a model of particular behavior of the test controller.",
  booktitle="Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems",
  chapter="13967",
  year="2003",
  month="april",
  pages="107--114",
  type="conference paper"
}