Detail publikace

The Test Controller Design Based on I-Path Concept

MIKA, D.

Originální název

The Test Controller Design Based on I-Path Concept

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In the paper the process of the test controller design and synthesis on register transfer level is described. The principle of circuit element access is discussed during the test plan scheduling. The formal tool - a mathematical logic and a set theory - is used as suitable tool for test controller design process. The problem of I-path is explained and a simple example of I-path is also demonstrated.

Klíčová slova

Register Transfer Level, I-path, I-mode, Circuit Under Test

Autoři

MIKA, D.

Rok RIV

2004

Vydáno

24. 4. 2003

Nakladatel

Faculty of Electrical Engineering and Communication BUT

Místo

Brno

ISBN

80-214-2379-X

Kniha

Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3

Strany od

624

Strany do

628

Strany počet

5

BibTex

@inproceedings{BUT13963,
  author="Daniel {Mika}",
  title="The Test Controller Design Based on I-Path Concept",
  booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
  year="2003",
  pages="624--628",
  publisher="Faculty of Electrical Engineering and Communication BUT",
  address="Brno",
  isbn="80-214-2379-X"
}