Detail publikace

A/D Switched-Current Converter with Built-in Self Testing Features

Originální název

A/D Switched-Current Converter with Built-in Self Testing Features

Anglický název

A/D Switched-Current Converter with Built-in Self Testing Features

Jazyk

en

Originální abstrakt

Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.

Anglický abstrakt

Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.

BibTex


@inproceedings{BUT13785,
  author="Ivo {Večeřa} and Radimír {Vrba} and Miroslav {Švéda}",
  title="A/D Switched-Current Converter with Built-in Self Testing Features",
  annote="Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.",
  address="The International Institute of Informatics and Systemics",
  booktitle="Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III",
  chapter="13785",
  institution="The International Institute of Informatics and Systemics",
  year="2003",
  month="february",
  pages="367--370",
  publisher="The International Institute of Informatics and Systemics",
  type="conference paper"
}