Detail publikace

Photo-induced charge and hole drift length measurement of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

AHMED, M.

Originální název

Photo-induced charge and hole drift length measurement of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Photo-induced charge (PIQ) measurements are employed for the characterization of evaporated ZnS:Mn alternating-current thin-film-electroluminescent (ACTFEL) devices. By changing the polarity of the applied voltage pulse, either electron or hole transport may be studied. PIQ trends indicate that electron transport is significantly more efficient than hole transport due to hole trapping in the ZnS. Hole trapping is characterized by a drift length of (180 plus minus 70) nm, a hole lifetime of 2 ps, and a capture cross-section of 7.10 power minus13 cm2.

Klíčová slova

Photo-induced charge, hole drift length, measurement, evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

Autoři

AHMED, M.

Rok RIV

2004

Vydáno

3. 11. 2004

Nakladatel

Fakulta elektrotechnická, Zapadočeská univezita v Plzni

Místo

Plzeň

ISBN

80-7043-300-0

Kniha

Elektortechnika a informatika 2004

Strany od

63

Strany do

66

Strany počet

4

BibTex

@inproceedings{BUT12613,
  author="Mustafa M. Abdalla {Ahmed}",
  title="Photo-induced charge and hole drift length measurement of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices",
  booktitle="Elektortechnika a informatika 2004",
  year="2004",
  pages="63--66",
  publisher="Fakulta elektrotechnická, Zapadočeská univezita v Plzni",
  address="Plzeň",
  isbn="80-7043-300-0"
}