Detail produktu

Automated test equipment for evaluation of radiation induced changes of PMOS and RADFET transistors I-V curves including their temperature coefficients

HOFMAN, J. HÁZE, J.

Typ produktu

funkční vzorek

Abstrakt

A fully automated test equipment (ATE) for evaluation of radiation induced changes of PMOS transistors I-V curves and their temperature coefficients has been developed and built. The ATE is designed to provide any combination of bias conditions and temperature profile during the irradiation. Three successful research experiments have been performed and the commercial applications have been negotiated.

Klíčová slova

Automated test equipment, thermoelectric cooler, thermometers, test software, test methods, temperature effects, RADFET, TID, PMOS, temperature coefficients, MTC

Datum vzniku

1. 7. 2015

Umístění

168 Maxwell Avenue, Harwell, DIDCOT, Oxfordshire, OX 11 0QT, UK.

Možnosti využití

K využití výsledku jiným subjektem je vždy nutné nabytí licence

Licenční poplatek

Poskytovatel licence na výsledek nepožaduje licenční poplatek

www

http://www.umel.feec.vutbr.cz/vyzkum/vysledky/funkcni-vzorky/