Feedback Control in Atomic Force Microscope used as a nano-manipulator

článek ve sborníku ve WoS nebo Scopus

angličtina

The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the atomic force micropes. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF. Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing performance of instruments like atomic force microscopes (AFM). A typical AFM consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system and a control system. The actual commercial AFM are using standard PI controller to position the micro-cantilever tip at a desired distance from the sample. There is still a need for studies showing the optimal way of tuning these controllers in order to achieve high closed-loop performances of the positioning. Choosing other controller structures, more suitable to deal with the compromise robustness/performance can be also a solution.

automatic control, atomic force microscopy, thermal noise

HROUZEK, M.

2004

5. 9. 2004

Orgit Ltd.

Glasgow, UK

80-86059-41-3

4th International Conference on Advanced Engineering Design

182

188

7