Detail publikace

Feedback Control in Atomic Force Microscope used as a nano-manipulator

Originální název

Feedback Control in Atomic Force Microscope used as a nano-manipulator

Anglický název

Feedback Control in Atomic Force Microscope used as a nano-manipulator

Jazyk

en

Originální abstrakt

The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the atomic force micropes. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF. Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing performance of instruments like atomic force microscopes (AFM). A typical AFM consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system and a control system. The actual commercial AFM are using standard PI controller to position the micro-cantilever tip at a desired distance from the sample. There is still a need for studies showing the optimal way of tuning these controllers in order to achieve high closed-loop performances of the positioning. Choosing other controller structures, more suitable to deal with the compromise robustness/performance can be also a solution.

Anglický abstrakt

The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the atomic force micropes. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF. Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing performance of instruments like atomic force microscopes (AFM). A typical AFM consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system and a control system. The actual commercial AFM are using standard PI controller to position the micro-cantilever tip at a desired distance from the sample. There is still a need for studies showing the optimal way of tuning these controllers in order to achieve high closed-loop performances of the positioning. Choosing other controller structures, more suitable to deal with the compromise robustness/performance can be also a solution.

BibTex


@inproceedings{BUT11550,
  author="Michal {Hrouzek}",
  title="Feedback Control in Atomic Force Microscope used as a nano-manipulator",
  annote="The aims of the presented paper are to make a concise state-of-art of the most commonly
used feedback loops for the atomic force micropes. Moreover, to propose a feedback control
loops in order to minimize the effect of the thermal noise on the weak forces measurements and
improve manipulation abilities of the AMF.
Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing
performance of instruments like atomic force microscopes (AFM). A typical AFM
consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system
and a control system. The actual commercial AFM are using standard PI controller to position
the micro-cantilever tip at a desired distance from the sample. There is still a need for studies
showing the optimal way of tuning these controllers in order to achieve high closed-loop performances
of the positioning. Choosing other controller structures, more suitable to deal with
the compromise robustness/performance can be also a solution.",
  address="Orgit Ltd.",
  booktitle="4th International Conference on Advanced Engineering Design",
  chapter="11550",
  institution="Orgit Ltd.",
  year="2004",
  month="september",
  pages="182",
  publisher="Orgit Ltd.",
  type="conference paper"
}