Detail publikace

Methods for topography artifacts compensation in scanning thermal microscopy

MARTINEK, J. KLAPETEK, P. CHARVÁTOVÁ CAMPBELL, A.

Originální název

Methods for topography artifacts compensation in scanning thermal microscopy

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Thermal conductivity contrast images in scanning thermal microscopy (SThM) are often distorted by artifacts related to local sample topography. Three methods for numerically estimating and compensating for topographic artifacts are compared in this paper: a simple approach based on local sample geometry at the probe apex vicinity, a neural network analysis and 3D finite element modeling of the probe–sample interaction. A local topography and an estimated probe shape are used as source data for the calculation in all these techniques; the result is a map of false conductivity contrast signals generated only by sample topography. This map can be then used to remove the topography artifacts from measured data.

Klíčová slova

Scanning thermal microscopy; Artifacts; Neural networks

Autoři

MARTINEK, J.; KLAPETEK, P.; CHARVÁTOVÁ CAMPBELL, A.

Rok RIV

2015

Vydáno

1. 8. 2015

Nakladatel

Elsevier

ISSN

0304-3991

Periodikum

Ultramicroscopy

Ročník

155

Číslo

1

Stát

Nizozemsko

Strany od

55

Strany do

61

Strany počet

7

URL

https://www.sciencedirect.com/science/article/pii/S0304399115000959

Plný text v Digitální knihovně

http://hdl.handle.net/11012/201148

BibTex

@article{BUT114643,
  author="Jan {Martinek} and Petr {Klapetek} and Anna {Charvátová Campbell}",
  title="Methods for topography artifacts compensation in scanning thermal microscopy",
  journal="Ultramicroscopy",
  year="2015",
  volume="155",
  number="1",
  pages="55--61",
  doi="10.1016/j.ultramic.2015.04.011",
  issn="0304-3991",
  url="https://www.sciencedirect.com/science/article/pii/S0304399115000959"
}