Detail publikace

SEM and AFM imaging of solar cells defects

ŠKARVADA, P. MACKŮ, R. DALLAEVA, D. SEDLÁK, P. GRMELA, L. TOMÁNEK, P.

Originální název

SEM and AFM imaging of solar cells defects

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.

Klíčová slova

Solar cells; Photomicroscopy; Scanning probe microscopy

Autoři

ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P.

Rok RIV

2015

Vydáno

6. 1. 2015

Nakladatel

SPIE

Místo

Bellingham, USA

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

9450

Číslo

9450

Stát

Spojené státy americké

Strany od

1

Strany do

6

Strany počet

6

BibTex

@article{BUT113013,
  author="Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Petr {Sedlák} and Lubomír {Grmela} and Pavel {Tománek}",
  title="SEM and AFM imaging of solar cells defects",
  journal="Proceedings of SPIE",
  year="2015",
  volume="9450",
  number="9450",
  pages="1--6",
  doi="10.1117/12.2049046",
  issn="0277-786X"
}