Detail publikace

Study of the Influence of Structural Defects on Properties of Silicon Solar Cells

ŠICNER, J. ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P.

Originální název

Study of the Influence of Structural Defects on Properties of Silicon Solar Cells

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Solar cells of common sizes contains many of these defects and it is not easy to determine the influence of particular defects on the characteristics of the whole solar cell. Therefore, in our research we use samples of size of square centimeter at which we can disentangle the influence of the defect. We localize the defect by using a CCD camera, we measure the electrical, thermal and optical properties of the sample and then study it by means an electron microscope, we find the damaged structure and put it to focused ion beam. We expect the change in electrical, thermal and optical properties of the sample.

Klíčová slova

Focused Ion Beam (FIB), Nondestructive Diagnostics, Solar Cell, Structural Defects

Autoři

ŠICNER, J.; ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.

Rok RIV

2014

Vydáno

1. 1. 2014

Nakladatel

Trans tech publication

Místo

Switzerland

ISSN

1013-9826

Periodikum

Key Engineering Materials (print)

Ročník

592-593

Číslo

1

Stát

Švýcarská konfederace

Strany od

449

Strany do

452

Strany počet

4

BibTex

@article{BUT105398,
  author="Jiří {Šicner} and Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý}",
  title="Study of the Influence of Structural Defects on Properties of Silicon Solar Cells",
  journal="Key Engineering Materials (print)",
  year="2014",
  volume="592-593",
  number="1",
  pages="449--452",
  doi="10.4028/www.scientific.net/KEM.592-593.449",
  issn="1013-9826"
}