Detail publikace

Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors

SITA, Z. SEDLÁKOVÁ, V. MAJZNER, J. SEDLÁK, P. ŠIKULA, J. GRMELA, L.

Originální název

Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors

Český název

Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors

Anglický název

Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors

Typ

článek v časopise

Jazyk

en

Originální abstrakt

The noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict the mode of possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, the spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing I-V characteristic dependent of the electric field orientation. We have found that the thermistors with high quality contacts has linear I-V characteristic, the noise spectral density is 1/f type and the third harmonic index is lower than 60 dB.The samples with poor quality contacts show the non-linear I-V characteristics, and excess noise is given by superposition of g-r and 1/fn type noises, and the third harmonic index is higher than 60 dB.

Český abstrakt

The noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict the mode of possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, the spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing I-V characteristic dependent of the electric field orientation. We have found that the thermistors with high quality contacts has linear I-V characteristic, the noise spectral density is 1/f type and the third harmonic index is lower than 60 dB. The samples with poor quality contacts show the non-linear I-V characteristics, and excess noise is given by superposition of g-r and 1/fn type noises, and the third harmonic index is higher than 60 dB.

Anglický abstrakt

The noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict the mode of possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, the spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing I-V characteristic dependent of the electric field orientation. We have found that the thermistors with high quality contacts has linear I-V characteristic, the noise spectral density is 1/f type and the third harmonic index is lower than 60 dB.The samples with poor quality contacts show the non-linear I-V characteristics, and excess noise is given by superposition of g-r and 1/fn type noises, and the third harmonic index is higher than 60 dB.

Klíčová slova

PTC chip sensors, noise spectroscopy, I-V characteristic non-linearity, quality evaluation

Rok RIV

2013

Vydáno

02.12.2013

Strany od

635

Strany do

644

Strany počet

10

BibTex


@article{BUT104034,
  author="Zdeněk {Sita} and Vlasta {Sedláková} and Jiří {Majzner} and Petr {Sedlák} and Josef {Šikula} and Lubomír {Grmela}",
  title="Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors",
  annote="The noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict the mode of possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, the spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing I-V characteristic dependent of the electric field orientation. We have found that the thermistors with high quality contacts has linear I-V characteristic, the noise spectral density is 1/f type and the third harmonic index is lower than 60 dB.The samples with poor quality contacts show the non-linear I-V characteristics, and excess noise is given by superposition of g-r and 1/fn type noises, and the third harmonic index is higher than 60 dB.",
  chapter="104034",
  number="4",
  volume="XX",
  year="2013",
  month="december",
  pages="635--644",
  type="journal article"
}