Detail publikace

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Originální název

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Anglický název

Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability

Jazyk

en

Originální abstrakt

In this paper we performed a detailed analysis of two approaches devoted to generation of input test vectors with respect to detection of stuck-at faults: the rst one is Automatic Test Pattern Generation, the second one is Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced ideas about their combination in order to create a new promising approach for testing reliable systems.

Anglický abstrakt

In this paper we performed a detailed analysis of two approaches devoted to generation of input test vectors with respect to detection of stuck-at faults: the rst one is Automatic Test Pattern Generation, the second one is Constrained-random Stimulus Generation. We evaluated their qualities as well as their drawbacks and introduced ideas about their combination in order to create a new promising approach for testing reliable systems.

BibTex


@inproceedings{BUT103529,
  author="Marcela {Zachariášová} and Cristiana {Bolchini} and Zdeněk {Kotásek}",
  title="Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability",
  annote="In this paper we performed a detailed analysis of two approaches devoted to
generation of input test vectors with respect to detection of stuck-at faults:
the rst one is Automatic Test Pattern Generation, the second one is
Constrained-random Stimulus Generation. We evaluated their qualities as well as
their drawbacks and introduced ideas about their combination in order
to create a new promising approach for testing reliable systems.",
  address="COST, European Cooperation in Science and Technology",
  booktitle="Proceedings of The Second Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale",
  chapter="103529",
  edition="NEUVEDEN",
  howpublished="print",
  institution="COST, European Cooperation in Science and Technology",
  year="2013",
  month="june",
  pages="35--38",
  publisher="COST, European Cooperation in Science and Technology",
  type="conference paper"
}