Detail publikace

The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope

VYROUBAL, P.

Originální název

The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, especially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter in design of scintillation detector of secondary electrons. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of microscope.

Klíčová slova

Shock wave, scintilation detector, simulation

Autoři

VYROUBAL, P.

Rok RIV

2013

Vydáno

18. 11. 2013

ISSN

1802-4564

Periodikum

ElectroScope - http://www.electroscope.zcu.cz

Ročník

2013

Číslo

5

Stát

Česká republika

Strany od

1

Strany do

5

Strany počet

5

BibTex

@article{BUT103128,
  author="Petr {Vyroubal}",
  title="The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2013",
  volume="2013",
  number="5",
  pages="1--5",
  issn="1802-4564"
}