Detail publikace

Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/f Noise Measurements

SANTO-ZARNIK, M. BELAVIC, D. SEDLÁKOVÁ, V. ŠIKULA, J. KOPECKÝ, M. SEDLÁK, P. MAJZNER, J.

Originální název

Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/f Noise Measurements

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

A pressure sensor with high resolution is of key importance for precise measurements in the low-pressure range. The intrinsic resolution of piezoresistive ceramic pressure sensors (CPSs) mainly depends on their functional sensitivity and the electronic noise in the thick-film resistors. Both the sensitivity and the noise level depend on the material and the structural properties, and the dimensions of the sensing structure. In general, the sensitivity can be increased and the noise can be reduced by using additional electronics for the signal processing, but this makes the sensor bigger, more complex and more expensive. In this study we discuss the technological limits for downscaling the sensors pressure range without any processing of the sensors signal. The intrinsic resolution of the piezoresistive pressure sensors designed for the pressure range 0 to 100 mbar and realised in LTCC (Low Temperature Cofired Ceramic) technology was evaluated and compared to the resolution of a commercial 100-mbar silicon pressure sensor.

Klíčová slova

LTCC pressure sensor, intrinsic resolution, noise spectral density

Autoři

SANTO-ZARNIK, M.; BELAVIC, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J.

Rok RIV

2013

Vydáno

1. 4. 2013

ISSN

1210-2512

Periodikum

Radioengineering

Ročník

22

Číslo

1

Stát

Česká republika

Strany od

227

Strany do

232

Strany počet

6

BibTex

@article{BUT102023,
  author="Marina {Santo-Zarnik} and Darko {Belavic} and Vlasta {Sedláková} and Josef {Šikula} and Martin {Kopecký} and Petr {Sedlák} and Jiří {Majzner}",
  title="Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/f Noise Measurements",
  journal="Radioengineering",
  year="2013",
  volume="22",
  number="1",
  pages="227--232",
  issn="1210-2512"
}