Detail publikace

Luminescence radiation spectroscopy of silicon solar cells

STOJAN, R. VANĚK, J. MALÝ, M. GVRITISHVILI, R. TOMÁNEK, P. FRANTÍK, O.

Originální název

Luminescence radiation spectroscopy of silicon solar cells

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

This paper deals about results of new potential in to use one of characteristics luminescence radiation for detection defects of solar cells. So polarization spectroscopy of defect in solar cells may be used to fitting characterization of silicon solar cells. Radiation emitted by the solar cell has a wave character that can interact with the silicon structures or hypothetically thin reflectance layer of solar cells. In our research we can observed the linear partially polarization luminescence light on poly-silicon crack defect. Spectral response of using CCD camera is approximately 300 to 1100 nm. Sinusoid dependence of luminescence intensity on the angle of linear polarization analyzer rotation shown this fact. The degree of polarization depends on the material, in this case the character of defect. Polarized light can be obtained in various ways. This fact opens up for potential next new questions in this widely course of study diagnostics defects silicon solar cells.

Klíčová slova

Solar cells, photoluminescence, electroluminescence, electromagnetic radiation, polarization, defect.

Autoři

STOJAN, R.; VANĚK, J.; MALÝ, M.; GVRITISHVILI, R.; TOMÁNEK, P.; FRANTÍK, O.

Rok RIV

2013

Vydáno

27. 9. 2013

Nakladatel

SPIE

Místo

Bellingham USA

ISSN

0277-786X

Periodikum

Proceedings of SPIE

Ročník

8825

Číslo

8825

Stát

Spojené státy americké

Strany od

882529

Strany do

882535

Strany počet

6

BibTex

@article{BUT101917,
  author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý} and Roman {Gvritishvili} and Pavel {Tománek} and Ondřej {Frantík}",
  title="Luminescence radiation spectroscopy of silicon solar cells",
  journal="Proceedings of SPIE",
  year="2013",
  volume="8825",
  number="8825",
  pages="882529--882535",
  doi="10.1117/12.2024290",
  issn="0277-786X"
}