Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- plně financující

ME 285

čeština

Šikula Josef, prof. Ing. RNDr., DrSc. - hlavní řešitel

Fakulta stavební
- odpovědné pracoviště (01.01.1989 - nezadáno)

ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. p. 89 ( p.)ISBN: 80-214-143.
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PAVELKA, J., TANUMA, N., TACANO, M., ŠIKULA, J., MUSHA, T. Temperature dependence of 1/f noise in p- and n-InGaAs/InAlAs heterostructures. Research Bulletin of Meisei University – Physical Sciences and Engineering, 2004, vol. 40, no. 1, p. 87 ( p.)ISSN: 1346-7239.
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ŠIKULA, J. Chybí název. In CARTS-EUROPE 99. East Sussex,England: ECII Ltd., 1999. p. 147 ( p.)ISBN: 80-01-0195.
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ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. p. 130 ( p.)ISBN: 1-874612-2.
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ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. p. 218 ( p.)ISBN: 1-874612-2.
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PAVELKA, J. Self-Healing Processes in Tantalum Capacitors. In Proceedings of Student EEICT 2002. Student EEICT 2002 vol.2. Brno: FEKT VUT Brno, 2002. p. 239 ( p.)ISBN: 80-214-2116-9.
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HÁJEK, K., ŠIKULA, J. Passive Component Non-Linearity and a Quality of Electrical filters. In Proceedings of CARTS 2002. Huntsville, Alabama: Components Technology Institute, Inc., 2002. p. 95 ( p.)ISBN: 0887-7491.
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TACANO, M., TANUMA, N., YOKOKURA, S., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T. Evaluation of Ni/n-SiC ohmic contacts by current noise measurements. In Proceedings of the 16th Int Conf Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, USA: World Scientific, 2001. p. 119 ( p.)ISBN: 981-02-4677-3.
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YOKOKURA, S., TANUMA, N., TACANO, M., HASHIGUCHI, S., ŠIKULA, J. Fully computer-controlled battery power source for low-frequency noise measurements. In Proceedings of the 16th Int. Conf. Noise in Physical Systems and 1/f Noise Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 721 ( p.)ISBN: 981-02-4677-3.
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ALIWI, I., CHOBOLA, Z., ŠIKULA, J. Non-linearity and Noise as a Quality Indicators for Silicon Solar Cells. In Proceedings of the 16th Int. Conf. Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 739 ( p.)ISBN: 981-02-4677-3.
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VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J. Failure Modes of Tantalum Capacitors Made by Different Technologies. In Proceedings of CARTS-Europe 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 76 ( p.)
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ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS-Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. p. 81 ( p.)
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PAVELKA, J. Burst noise in thin amorphous films. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 105 ( p.)ISBN: 80-214-1992-X.
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PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 91 ( p.)ISBN: 981-02-4677-3.
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ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 289 ( p.)ISBN: 0887-7491.
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REYNOLDS, C., VAŠINA, P., ZEDNÍČEK, T., ŠIKULA, J., PAVELKA, J. Failure Modes of Tantalum Capacitors Made by Different Technologies. In Proceedings of 21st Capacitor and Resistor Technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. p. 271 ( p.)ISBN: 0887-7491.
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HRUŠKA, P. Noise reliability indicators for PN junction devices. In Nové trendy ve fyzice. Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, Ústav fyziky,Brno: VUT Brno, 2001. p. 80 ( p.)ISBN: 80-214-1992-X.
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TANUMA, N., YASUKAWA, S., YOKOKURA, S., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T., TACANO, M. Electron Cyclotron Resonance Plasma Etching of n-SiC and Evaluation of Ni/n-SiC Contacts by Current Noise Measurements. Japanese Journal of Applied Physics, 2001, vol. 40, no. 6A, p. 3979 ( p.)ISSN: 0021-4922.
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PAVELKA, J., ŠIKULA, J., GRMELA, L., TACANO, M., HASHIGUCHI, S. Noise and Self-Healing of Tantalum Capacitors. Capacitor and Resistor Technology, 2002, vol. 2002, no. 4/2002, p. 181 ( p.)ISSN: 0887-7491.
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ANDO, M., HASHIGUCHI, S., ŠIKULA, J., MATSUI, T. Dependence of Hooge parameter of InAs heterostructure on temperature. Microelectronics Reliability, 2000, vol. 40, no. 11, p. 1921 ( p.)ISSN: 0026-2714.
Detail

ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. p. 93 ( p.)ISBN: 80-214-143.
Detail