prof. RNDr. Tomáš Šikola, CSc.

Středoevropský technologický institut VUT (CEITEC VUT)

Literatura doporučena v každé přednášce. (EN)

angličtina

Ultraviolet Photoelectron Spectroscopy and valence band mapping by AR PES.
Real-time LEEM observation of surface processes and data interpretation.
Electron beam lithography at ultimate resolution
Nanoimprint lithography: how to achieve sub-100 nm resolution
Electron Energy Loss Spectroscopy for optical and IR applications
Electron Vortex beams to improve resolution of electron microscopy
Dynamic optical spectroscopy in nanophotonics and magnetooptics
1D nanostructures for electronic, photonic and tribology applications
2D materials – properties and applications
Bioimaging, biosensing and bioengineering at micro and nanoscale
Nanomaterials in Plasmonics and Catalysis
EELS and CL for chemical and optical quantification in (scanning) transmission electron microscopy

• Program STIAMN doktorský

  obor AM , 1. ročník, letní semestr, 0 kreditů, povinně volitelný
  obor ANTMT , 1. ročník, letní semestr, 0 kreditů, povinně volitelný