doc. Ing.

Vlasta Sedláková

Ph.D.

FEKT, UFYZ – docent

+420 54114 6025
sedlaka@feec.vutbr.cz

Odeslat VUT zprávu

doc. Ing. Vlasta Sedláková, Ph.D.

Publikace

  • 2019

    SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Life-time. In Proceedings of 2nd Passive Components Networking Symposium. Brno: European Passive Components Institute s.r.o., 2019. s. 90-97. ISBN: 978-80-907447-0-7.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O.; URRUTIA, L. A Simple Analytical Model of Capacity Fading for Lithium–Sulfur Cells. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2019, roč. 34, č. 6, s. 5779-5786. ISSN: 0885-8993.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. Cycle life and degradation sources in Li-S cells. In Technical Digest of 13th Conference „Electron Technology” ELTE and 43rd International Microelectronics and Packaging IMAPS Poland Conference. Kraków, Poland: International Microelectronics and Packaging Society Poland Chapter, 2019. s. 83-84. ISBN: 978-83-932464-3-4.
    Detail

  • 2018

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; ČECH, O. SOURCES OF DEGRADATION IN LI-S CELLS. In 39. Nekonvenční zdroje elektrické energie. 2018. s. 95-97. ISBN: 978-80-02-02786-7.
    Detail

  • 2017

    KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J. Low frequency noise of electrochemical power sources. In 2017 International Conference on Noise and Fluctuations (ICNF). Vilnius, Lithuania: IEEE, 2017. s. 1-4. ISBN: 978-1-5090-2760-6.
    Detail | WWW

    KUPAROWITZ, M.; SEDLÁKOVÁ, V.; GRMELA, L. LEAKAGE CURRENT DEGRADATION DUE TO ION DRIFT AND DIFFUSION IN TANTALUM AND NIOBIUM OXIDE CAPACITORS. METROL MEAS SYST, 2017, roč. 24, č. 2, s. 255-264. ISSN: 0860-8229.
    Detail | WWW

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; OSTRÝ, L. Equivalent model for AVX MLCC - FINAL REPORT - STAGE III. 2017. s. 1-49.
    Detail

    KUPAROWITZ, T.; SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Supercapacitor Degradation and Reliability. In Passive Components Networking days EPCI Passive Components Networking Symposium 2017. 2017. s. 63-68. ISBN: 978-80-905768-8-9.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; KUPAROWITZ, M. Temperature Dependence of Leakage Current Degradation of Tantalum Capacitors at High Electric Field. In PCSN 2017 Proceedings. Česká republika: Ing. Vladislav Pokorný - LITERA BRNO, Tábor 43a, 612 00 Brno, 2017. s. 128-136. ISBN: 978-80-905768-8-9.
    Detail

  • 2016

    SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor degradation assesment by power cycling and calendar life tests. METROL MEAS SYST, 2016, roč. 23, č. 3, s. 345-358. ISSN: 0860-8229.
    Detail

    SZEWCZYK, A.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T. Voltage dependence of supercapacitor capacitance. METROL MEAS SYST, 2016, roč. 23, č. 3, s. 403-411. ISSN: 0860-8229.
    Detail

    SEDLÁK, P.; KUBERSKÝ, P.; ŠKARVADA, P.; HAMÁČEK, A.; SEDLÁKOVÁ, V.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J. Current-fluctuation measurements of amperometric gas sensors prepared by three different technology procedures. Metrology and Measurement Systems, 2016, roč. 23, č. 4, s. 531-543. ISSN: 2300-1941.
    Detail | WWW | Plný text v Digitální knihovně

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Supercapacitor Parameters Degradation Analysis by Energy Cycling and Calendar Life Tests. Space Passive Component Days. European Space Agency, 2016. s. 1-13.
    Detail | WWW

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M.; OSTRÝ, L. Equivalent model for AVX MLCC - FINAL REPORT - STAGE II. 2016. s. 1-70.
    Detail

  • 2015

    SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P.; KUPAROWITZ, T.; BUERGLER, B.; VAŠINA, P. Supercapacitor equivalent electrical circuit model based on charges redistribution by diffusion. Journal of Power Sources, 2015, roč. 2015, č. 286, s. 58-65. ISSN: 0378-7753.
    Detail | WWW

    SEDLÁKOVÁ, V.; ŠIKULA, J.; VRBA, R.; MAJZNER, J.; SEDLÁK, P.; SANTO-ZARNIK, M.; BELAVIC, D. Noise in piezoresistive pressure sensors. In Noise and Fluctuation (ICNF). IEEE, 2015. s. 1-4. ISBN: 978-1-4673-8335-6.
    Detail

    SEDLÁK, P.; KUBERSKÝ, P.; MAJZNER, J.; NEŠPŮREK, S.; ŠIKULA, J.; MACKŮ, R.; ŠKARVADA, P.; SEDLÁKOVÁ, V.; HAMÁČEK, A. Investigation of adsorption-desorption phenomenon by using current fluctuations of amperometric NO2 gas sensor. In Noise and Fluctuations (ICNF). IEEE, 2015. s. 1-4. ISBN: 978-1-4673-8335-6.
    Detail | WWW

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T.; MÍVALT, F.; LANG, M. Equivalent model for AVX MLCC - FINAL REPORT - STAGE I. 2015. s. 1-53.
    Detail

    KUBERSKÝ, P.; SEDLÁK, P.; HAMÁČEK, A.; NEŠPŮREK, S.; KUPAROWITZ, T.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V.; GRMELA, L.; SYROVÝ, T. Quantitative fluctuation-enhanced sensing in amperometric NO2 sensors. Chemical Physics, 2015, roč. 456, č. 1, s. 111-117. ISSN: 0301-0104.
    Detail | WWW

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SEDLÁK, P.; MAJZNER, J.; KUPAROWITZ, T. Technical note 11: Modeling of supercapacitors ageing. 2015. s. 1-50.
    Detail

  • 2014

    HASSE, L.; BABICZ, S.; KACZMAREK, L.; SMULKO, J.; SEDLÁKOVÁ, V. Quality assessment of ZnO-based varistors by 1/f noise. Microelectronics Reliability, 2014, roč. 54 (2014), č. 1, s. 192-199. ISSN: 0026-2714.
    Detail

    KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Charge Redistribution and Restoring voltage of Supercapacitors. ElectroScope - http://www.electroscope.zcu. cz, 2014, roč. 2014, č. 3, s. 1-7. ISSN: 1802- 4564.
    Detail | WWW

    KUPAROWITZ, T.; SEDLÁKOVÁ, V.; SZEWCZYK, A.; HASSE, L.; SMULKO, J.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J. Supercapacitors – Charge Redistribution and Restoring Voltage. In Proceedings. Brno: Vysoké učení technické v Brně, 2014. s. 145-150. ISBN: 978-80-214-4985- 5.
    Detail

  • 2013

    SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; MAJZNER, J.; VONDRA, M.; KUBERSKÝ, P.; NEŠPŮREK, S.; HAMÁČEK, A. Noise in Amperometric NO2 Sensor. In Proceedings of 22nd International Conference on Noise and Fluctuations. Montpelier, France: IEEE, 2013. s. 1-4. ISBN: 978-1-4799-0670- 3.
    Detail

    SANTO-ZARNIK, M.; BELAVIC, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. Comparison of the Intrinsic Characteristics of LTCC and Silicon Pressure Sensors by Means of 1/ f Noise Measurements. Radioengineering, 2013, roč. 22, č. 1, s. 227-232. ISSN: 1210- 2512.
    Detail

    SITA, Z.; SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; ŠIKULA, J.; GRMELA, L. Analysis of noise and non-linearity of I- V characteristics of positive temperature coefficient chip thermistors. METROL MEAS SYST, 2013, roč. XX, č. 4, s. 635-644. ISSN: 0860- 8229.
    Detail

    VONDRA, M.; SEDLÁK, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; MAJZNER, J.; SMULKO, J.; HASSE, L. A FPGA- Based Measurement System with QCM. In A FPGA- Based Measurement System with QCM. Žilina: EDIS - Publishing Institution of the University of Zilina, 2013. s. 13-15. ISBN: 978-80-554-0807- 1.
    Detail

    SANTO-ZARNIK, M.; SEDLÁKOVÁ, V.; BELAVIC, D.; ŠIKULA, J.; MAJZNER, J.; SEDLÁK, P. Estimation of the long-term stability of piezoresistive LTCC pressure sensors by means of low- frequency noise measurements. Sensors and Actuators, 2013, roč. 199, č. 1, s. 334-343. ISSN: 0924- 4247.
    Detail

  • 2012

    SEDLÁKOVÁ, V.; ŠIKULA, J.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. Noise in Submicron Metal-Oxide-Semiconductor Field Effect Transistors: Lateral Electron Density Distribution and Active Trap Position. Japanese Journal of Applied Physics, 2012, roč. 2012 (51), č. 1, s. 024105- 1 (024105-5 s.)ISSN: 0021- 4922.
    Detail

    VONDRA, M.; SEDLÁK, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HOLCMAN, V. Equivalent circuit of polypyrrole-based QCM. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Lubljana Slovenia: 2012. s. 405-409. ISBN: 978-961-92933-2-4.
    Detail

    SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; KOPECKÝ, M.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Evaluation of piezoresistive ceramic pressure sensors using noise measurements. Informacije MIDEM, 2012, roč. 42, č. 2, s. 109-114. ISSN: 0352- 9045.
    Detail

    SEDLÁKOVÁ, V.; MAJZNER, J.; SEDLÁK, P.; HOLCMAN, V.; ŠIKULA, J.; SANTO-ZARNIK, M.; BELAVIC, D.; HROVAT, M. Influence of Functional Resistors on Offset Voltage Noise in Thick- Film Pressure Sensors. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. s. 393-398. ISBN: 978-961-92933-2- 4.
    Detail

    SEDLÁK, P.; ŠIKULA, J.; MAJZNER, J.; SEDLÁKOVÁ, V. Model of Adsorpce- Desorption Noise in QCM Gas Sensors. In Proceedings of the conference New Trends in Physics. Brno: Ústav fyziky, FEKT, Vysoké učení technické v Brně, 2012. s. 187-190. ISBN: 978-80-214-4594- 9.
    Detail

    SANTO-ZARNIK, M.; BELAVIČ, D.; SEDLÁKOVÁ, V.; ŠIKULA, J.; KOPECKÝ, M.; SEDLÁK, P.; MAJZNER, J. INTRINSIC RESOLUTION OF A PIEZORESISTIVE CERAMIC PRESSURE SENSOR. In EDS 2012 Proceedings. IMAPS CZ& SK, 2012. s. 251-256. ISBN: 978-80-214-4539- 0.
    Detail

    SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; TEVEROVSKY, D.; ZEDNÍČEK, T. IONS ELECTROMIGRATION IN TANTALUM CAPACITORS. In EDS 2012 Proceedings. IMAPS CZ& SK, 2012. s. 343-348. ISBN: 978-80-214-4539- 0.
    Detail

    CICHOSZ, J.; HASSE, L.; SZEWCZYK, A.; SEDLÁK, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Non-linear electro-ultrasonic spectroscopy of high- voltage varistors. In XI Krajowa Konferencja Elektroniki. Warszawa: Sigma- Not, 2012. s. 115-120. ISBN: 978-83-934712-0- 1.
    Detail

    SEDLÁK, P.; ŠIKULA, J.; VONDRA, M.; SEDLÁKOVÁ, V.; MAJZNER, J.; HOLCMAN, V. Fluctuation-enhanced gas sensing using polypyrrole-based QCM and its adsorption- desorption kinetics. In Proceedings MIDEM 2012. Ljubljana: MIDEM, 2012. s. 399-404. ISBN: 978-961-92933-2- 4.
    Detail

    KOPECKÝ, M.; SEDLÁKOVÁ, V.; HOLCMAN, V.; PETTERSSON, H. Analysis of transport mechanisms for the Ta2O5 layers for low temperature range 80 K to 300 K. In MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings. Slovinsko: MIDEM, 2012. s. 145-150. ISBN: 978-961-92933-2- 4.
    Detail

  • 2011

    SEDLÁK, P.; TOFEL, P.; SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J.; HASSE, L. Ultrasonics spectroscopy of silicon single crystal. METROL MEAS SYST, 2011, roč. 18, č. 4, s. 621-630. ISSN: 0860- 8229.
    Detail

    KOPECKÝ, M.; CHVÁTAL, M.; SEDLÁKOVÁ, V. Electron Transport in Ta Nanolayers: Application to Tantalum Capacitors. In Polymer Electronics and Nanotechnologies: towards System Integration. first. Koszykowa 75, 00 662 , Warsaw, Poland: Piotr Firek, Ryszard Kisiel, 2011. s. 137-139. ISBN: 978-83-7207-874- 2.
    Detail

  • 2010

    TOFEL, P.; ŠIKULA, J.; SEDLÁKOVÁ, V.; TRČKA, T. Electro Ultrasonic Spectroscopy of Magnesium Composites. Jemná mechanika a optika, 2010, roč. 55, č. 5/ 2010, s. 142-144. ISSN: 0447- 6441.
    Detail

    SEDLÁKOVÁ, V. NON- DESTRUCTIVE TESTING OF PASSIVE ELECTRONIC COMPONENTS. Vědecké spisy vysokého učení technického v Brně, 2010. s. 1-38.
    Detail

    SEDLÁKOVÁ, V. Non- destructive testing of passive electronic components. Brno: Vysoké učení technické v Brně, 2010. s. 1-117.
    Detail

    KOPECKÝ, M.; CHVÁTAL, M.; SEDLÁKOVÁ, V. Charge Carrier Transport in Ta2O5 Oxide Nanolayers. ElectroScope - http://www.electroscope.zcu. cz, 2010, roč. 2010, č. 3, s. 1-4. ISSN: 1802- 4564.
    Detail

  • 2009

    ŠIKULA, J.; SEDLÁKOVÁ, V.; CHVÁTAL, M.; PAVELKA, J.; TACANO, M.; TOITA, M. RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position. AIP conference proceedings, 2009, roč. 1129, č. 1, s. 205-208. ISSN: 0094- 243X.
    Detail

    SEDLÁKOVÁ, V. Závěrečná zpráva k řešení grantového projektu č. 102/07/ P482. 2009.
    Detail

    CHVÁTAL, M.; ŠIKULA, J.; SEDLÁKOVÁ, V.; KNÁPEK, A. Measurements and Theoretical Approximations of VA Characteristics MOSFETs. Jemná mechanika a optika, 2009, roč. 54, č. 10, s. 278-279. ISSN: 0447- 6441.
    Detail

  • 2008

    TOFEL, P.; SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistor Testing by Electro - Ultrasonic Spectroscopy with DC Electric Signal. In Reliability and Life- time Prediction ISSE2008. 1. Hungary: 2008. s. 56-57. ISBN: 978-963-06-4915- 5.
    Detail

    SEDLÁKOVÁ, V. Dílčí zpráva k řešení grantového projektu č.102/07/ P482. 2008.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; TOFEL, P.; MAJZNER, J. Electro-ultrasonic spectroscopy of polymer- based thick film layers. Microelectronics Reliability, 2008, roč. 48, č. 6, s. 886-889. ISSN: 0026- 2714.
    Detail

    ŠIKULA, J.; HÁJEK, K.; SEDLÁKOVÁ, V.; TOFEL, P.; MAJZNER, J. Improved Signal to Noise Ratio of Electro- ultrasonic Spectroscopy. ElectroScope - http://www.electroscope.zcu. cz, 2008, roč. 2008, č. 6, s. 1-4. ISSN: 1802- 4564.
    Detail

  • 2007

    MAJZNER, J.; SEDLÁKOVÁ, V.; TOFEL, P.; SEDLÁK, P. NOISE IN ULTRASONIC TRANSDUCER. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, 2007. s. 94-97. ISBN: 978-80-7355-078- 3.
    Detail

    ŠIKULA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; TACANO, M.; TOITA, M. RTS Noise and quantum transitions in submicron MOSFETs. In New Trends in Physics. Brno: VUT, 2007. s. 138-141. ISBN: 978-80-7355-078- 3.
    Detail

    SEDLÁKOVÁ, V.; MAJZNER, J.; ŠIKULA, J. Noise and Electro- Ultrasonic Spectroscopy of Polymer Based Conducting Layers. In Noise and Fluctuations. USA: American Institute of Physics, 2007. s. 277-280. ISBN: 978-0-7354-0432- 8.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro- Ultrasonic Spectroscopy. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies& Materials Association, 2007. s. 321-328. ISBN: 0-7908-0114- 0.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J. Thick Film Resistors Testing by Electro- Ultrasonic Spectroscopy. 2007, roč. 2007, č. Nov/ Dec, s. 16-20.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; NAVAROVÁ, H.; PAVELKA, J.; HLÁVKA, J.; SITA, Z. Leakage Current, Noise and Reliability of NbO and Ta Capacitors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. s. 436-441.
    Detail

    SEDLÁKOVÁ, V. Electro- ultrasonic Spectroscopy of Polymer Based and Cermet Thick Film Resistors. In Proceedings EMPC 2007. Finsko: IMAPS Nordic, 2007. s. 450-455.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; MAJZNER, J. Electro-Ultrasonic Spectroscopy - New Method for Ppolymer Based Conducting Layers Characterisation. In Proceedings of the conference New Trends in Physics. Brno, ČR: Ústav fyziky FEKT VUT v Brně, 2007. s. 130-133. ISBN: 978-80-7355-078- 3.
    Detail

    ŠIKULA, J.; SEDLÁKOVÁ, V.; NAVAROVÁ, H.; HLÁVKA, J.; TACANO, M.; SITA, Z. Niobium Oxide and Tantalum Capacitors: Leakage Current and M-I- S Model Parameters. In Proceedings of CARTS USA 2007. USA: Electronic Components, Assemblies& Materials Association, 2007. s. 337-345. ISBN: 0-7908-0114- 0.
    Detail

  • 2006

    SEDLÁKOVÁ, V., ŠIKULA, J. Charge carrier transport and noise in polymer based thick films. In 4th European Microelectronics and Packaging Symposium with Table-Top Exhibition - Proceedings. Slovinsko: MIDEM, 2006. s. 15 ( s.)ISBN: 961-91023-4- 7.
    Detail

    P. Sedlak, J. Majzner, J. Sikula and V. Sedlakova. Finite element model of noise in piezoceramic sensor. In Proceedings / EMPS 2006 - 4th European Microelectronics and Packaging Symposium with Table- Top Exhibition. Ljubljana, Slovenia: MIDEM, 2006. s. 325 ( s.)ISBN: 961-91023-4- 7.
    Detail

    SEDLÁKOVÁ, V.; SEDLÁK, P.; ŠIKULA, J.; HÁJEK, K. Application of Electro- Ultrasonic Spectroscopy for NDT of Electronic Components. In Defektoskopie 2006 Proceeding. Brno: Czech Society for Nondestructive Testing, 2006. s. 225 ( s.)ISBN: 80-214-3290- X.
    Detail

    ŠIKULA, J., HEFNER, Š., SEDLÁKOVÁ, V., HÁJEK, K. Electro- Ultrasonic Spectroscopy of Conducting Solids. In DGZfP Proceedings BB 103- CD. Berlin: DGZfP, 2006. s. 150 ( s.)ISBN: 3- 931381.
    Detail

    ŠIKULA, J.; SEDLÁKOVÁ, V.; SITA, Z. Charge Carriers Transport and Noise in Niobium Oxide and Tantalum Capacitors. In EDS ' 06 IMAPS CS International Conference Proceedings. Brno, ČR: Ing. Zdeněk Novotný CSc., 2006. s. 154 ( s.)ISBN: 80-214-3246- 2.
    Detail

    ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO- ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In Abstracts of 9th European Conference of NDT. Berlin: DGZIP, 2006. s. Fr.1.5. 2 ( s.)
    Detail

    ŠIKULA, J., HÁJEK, K., SEDLÁKOVÁ, V., HEFNER, Š. ELECTRO- ULTRASONIC SPECTROSCOPY OF CONDUCTING SOLIDS. In 9th European Conference of NDT. Berlín, Německo: DGZIP, 2006. s. Fr.1.5. 2 ( s.)ISBN: 3- 931381.
    Detail

    ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z.; HÖSCHEL, P.; TACANO, M. Niobium Oxide and Tantalum Capacitors: Quantum Effects in Charge Carrier Transport. In Proceedings CARTS USA 2006 - The 26th Symposium for Passive Components. Orlando, Florida: Electronic Components, Assemblies and Materials Association, 2006. s. 421 ( s.)ISBN: 0-7908-0108- 6.
    Detail

    ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; SITA, Z. Charge Carrier Transport in NbO and Ta Capacitors in Temperature Range 100 to 300 K. In Proceeding of CARTS Europe 2006 - 20th annual passive components symposium. Bad Homburg, Německo: Electronic Components, Assemblies and Materials Association, 2006. s. 189 ( s.)ISBN: 0-7908-0110- 8.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; SPIRALSKI, L. Polymer Based Thick Films - Material Quality and Interface Resistance Evaluation. In XXX International Conference of IMAPS Poland Chapter Proceedings. Krakow, Poland: Institute of Electron Technology - Cracow Division, 2006. s. 95 ( s.)ISBN: 83-917701-3- 3.
    Detail

  • 2005

    P. Dobis, J. Brüstlová, V. Sedláková. Learning and Tutorial Supports for Bachelor Physics at Brno University of Technology. In Proceedings of the 4th International Conference on Physics Teaching in Engineering Education - PTEE 2005. Brno: European Physical Society and European Society for Engineering Education, 2005. s. 72 ( s.)ISBN: 80-903063-6- 5.
    Detail

    PAVELKA, J., SEDLÁKOVÁ, V., ŠIKULA, J., HAVRÁNEK, J., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in Submicron MOSFETs: High Field Effects. In Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780. Salamanka, Španělsko: University of Salamanca, 2005. s. 339 ( s.)ISBN: 0-7354-0267- 1.
    Detail

    SEDLÁKOVÁ, V.; ŠIKULA, J.; GRMELA, L.; HÖSCHEL, P.; SITA, Z.; HASHIGUCHI, S.; TACANO, M. Noise and Carge Storage in Nb2O5 Thin Films. In Noise and Fluctuations. United States of America: American Institute of Physics, 2005. s. 135 ( s.)ISBN: 0-7354-0267- 1.
    Detail

    GRILL, R. Tantalum and Niobium Capacitors: Technology and Characteristic Parameters Comparison. In 15th European Microelectronics and Packaging Conference Proceedings. Bruggy, Belgie: IMAPS Benelux, 2005. s. 540 ( s.)
    Detail

    P. Dobis, J. Brüstlová, V. Sedláková. Europhysics Conference Abstracts, Vol. 29G: Learning and Tutorial Supports for Bachelor Physics at Brno University of Technology. Europhysics Conference Abstracts, Vol. 29G. 4th International Conference on Physics Teaching in Engineering Education - PTEE 2005. Europhysics Conference Abstracts, Vol. 29G. Brno: European Physical Society, 2005. s. 7- 2 ( s.)ISBN: 2-914771-28- 2.
    Detail

    SEDLÁKOVÁ, V., ŠIKULA, J. Charge Carrier Transport in Polymer- Based Thick Resistive Films. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. s. 93 ( s.)ISSN: 0887- 7491.
    Detail

    ŠIKULA, J.; SEDLÁKOVÁ, V.; HLÁVKA, J.; HÖSCHEL, P.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. s. 210 ( s.)ISSN: 0887- 7491.
    Detail

    ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; GRILL, R.; SITA, Z.; ZEDNÍČEK, T.; TACANO, M. Niobium Oxide and Tantalum Capacitors: M-I- S Model Parameters Comparison. In 25th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. 2005. s. 244 ( s.)ISSN: 0887- 7491.
    Detail

    TACANO, M., ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V. RTS Noise in Submicron MOSFETs: Low and High Field Effects. In Proceedings of EDS'05 Electronic Devices and Systems IMAPS CS Int. Conf. Brno: VUT, 2005. s. XV ( s.)ISBN: 80-214-2990- 9.
    Detail

  • 2004

    SEDLÁKOVÁ, V., SEDLÁK, P., ŠIKULA, J., ROČAK, D., HROVAT, M., SANTO-ZARNIK, M., BELAVIC, D. Analysis of silver diffusion into thick film resistor layers. In Proceedings of 3rd European Microelectronics and Packaging Symposium with Table- Top Exhibition. Lanskroun: IMAPS CZ& SK Chapter, 2004. s. 660 ( s.)ISBN: 80-239-2835- X.
    Detail

    HÁJEK, K., SEDLÁKOVÁ, V., MAJZNER, J., HEFNER, Š., ŠIKULA, J. Non-linearity and noise characterisation of thick- film resistors after high voltage stress. In Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition. Lanskroun: IMAPS CZ& SK Chapter, 2004. s. 421 ( s.)ISBN: 80-239-2835- X.
    Detail

    SEDLÁKOVÁ, V., ŠIKULA, J. Thick film resistor characterisation by non- linearity and resistance change after high voltage stress. In New Trends in Physics - Proceedings of the Conference. Brno: Department of Physics FEEC, Brno University of Technology, 2004. s. 88 ( s.)ISBN: 80-7355-024- 5.
    Detail

    ŠIKULA, J., SEDLÁKOVÁ, V., DOBIS, P. Noise and Non- Linearity as Reliability Indicators of Electronic Devices. Informacije MIDEM, 2004, roč. 2003, č. 4, s. 213-221. ISSN: 0352- 9045.
    Detail

    ŠIKULA, J., PAVELKA, J., SEDLÁKOVÁ, V., TACANO, M., HASHIGUCHI, S., TOITA, M. RTS in submicron MOSFETs and quantum dots. In Proceedings of SPIE - Noise and Information in Nanoelectronics, Sensors, and Standards II. United States of America: The Society of Photo- Optical Instrumentation Engineers, 2004. s. 64 ( s.)ISBN: 0-8194-5394- 3.
    Detail

    SEDLÁKOVÁ, V., MELKES, F., DOBIS, P., ŠIKULA, J., TACANO, M., HASHIGUCHI, S. Non- lineartiy changes induced by current stress in thick film resistors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. s. 154 ( s.)ISSN: 0887- 7491.
    Detail

    ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L. Conductivity mechanisms and breakdown of NbO capacitors. In 24th Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: ECA, 2004. s. 141 ( s.)ISSN: 0887- 7491.
    Detail

    ŠIKULA, J.; HLÁVKA, J.; SEDLÁKOVÁ, V.; HÖSCHEL, P.; ZEDNÍČEK, T.; SITA, Z. Charge Carrier Transport and Storage in NbO Capacitors. In Proceedings of 18th European Passive Components Conference. United Kingdom: ECA - Electronic Components, Assemblies & Materials Association, 2004. s. 178 ( s.)
    Detail

  • 2003

    SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In Proceedings of 14th European Microelectronics and Packaging Conference. Německo: IMAPS Germany, 2003. s. 127 ( s.)
    Detail

    SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D. The effect of silver diffusion from contact electrode into thick film resistors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. s. 201 ( s.)ISBN: 0887- 7491.
    Detail

    ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T. Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors. In CARTS - EUROPE 2003 Proceedings. United Kingdom: Electronic Components Institute Internationale Ltd., 2003. s. 281 ( s.)ISBN: 0887- 7491.
    Detail

    SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/ graphite thick conducting films. In Proceedings of the 17th International Conference Noise and Fluctuations. Czech Republic: CNRL s.r.o., 2003. s. 201 ( s.)ISBN: 80-239-1005- 1.
    Detail

    ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., VRBA, R., MELKES, F., ROCAK, D., BELAVIC, D., TACANO, M., HASHIGUCHI, S. Current density distribution, noise and non- linearity of thick film resistors. In 23rd Capacitor and Resistor Technology Symposium. Capacitor and Resistor Technology. U.S.A.: 2003. s. 112 ( s.)ISSN: 0887- 7491.
    Detail

    SEDLÁKOVÁ, V., BRÜSTLOVÁ, J., ŠIKULA, J., HLÁVKA, J., COCKER, J., ADAMS, K., GREENHILL, D. Noise of carbon/ graphite thick conducting films. In Noise and Fluctuations. Brno: CNRL, 2003. s. 201 ( s.)ISBN: 80-239-1005- 1.
    Detail

    ŠIKULA, J., DOBIS, P., SEDLÁKOVÁ, V. Noise and non- linearity as reliability indicators of electronic devices. In MIDEM 2003 Conference Proceedings. Slovenia: MIDEM Slovenia, 2003. s. 3 ( s.)ISBN: 961-91023-1- 2.
    Detail

    SEDLÁKOVÁ, V., DOBIS, P., ŠIKULA, J., HOSCHL, P., SITA, Z., ZEDNÍČEK, T. Low Frequency Noise of Nb2O5 Thin Insulating Films. In Proceedings of the 17th International Nonference Noise and Fluctuations ICNF 2003. Czech Republic: CNRL s.r.o., 2003. s. 141 ( s.)ISBN: 80-239-1005- 1.
    Detail

    BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J. An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick- Film Resistors. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: CNRL, 2003. s. 40 ( s.)ISBN: 80-238-9094- 8.
    Detail

  • 2002

    SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. s. 171 ( s.)ISBN: 0887- 7491.
    Detail

    SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. s. 245 ( s.)ISBN: 961-91023-0- 4.
    Detail

    SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J. Partial Discharges and Acoustic Emission in M-I- M Structures. In Noise and Non- linearity Testing of Modern Electronic Components. Brno: Ing. Zdeněk Novotný, CSc., 2002. s. 140 ( s.)ISBN: 80-238-9094- 8.
    Detail

    SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th Conference STUDENT EEICT 2002. Brno: Ing. Zdeněk Novotný, CSc., 2002. s. 244 ( s.)ISBN: 80-214-2115- 0.
    Detail

    SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK- FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. s. 320 ( s.)ISBN: 83-904462-8- 6.
    Detail

    SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th ECNDT. Leganes, Madrid: Spanish Society for NDT AEND, 2002. s. 215 ( s.)ISBN: 84-699-8573- 6.
    Detail

    ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V. Low-Frequency Noise of Thick- Film Resistors as Quality and Reliability Indicator. Microelectronics Reliability, 2002, roč. 41, č. 4, s. 531-542. ISSN: 0026- 2714.
    Detail

    ŠIKULA, J.; HLÁVKA, J.; PAVELKA, J.; SEDLÁKOVÁ, V.; GRMELA, L.; TACANO, M.; HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. Active and Passive Electronic ComponentsISSN, 2002, roč. 25, č. 2, s. 161 ( s.)ISSN: 0882- 7516.
    Detail

    ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp loading. NDT Welding Bulletin, 2002, roč. 2002, č. 12, s. 4 ( s.)ISSN: 1213- 3825.
    Detail

    ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetika vzniku trhlin v žule při rostoucím zatěžování. NDT Welding Bulletin, 2002, roč. 2002, č. 2, s. 17 ( s.)ISSN: 1213- 3825.
    Detail

    ŠIKULA, J., KOKTAVÝ, P., KOŘENSKÁ, M., PAVELKA, J., SEDLÁKOVÁ, V., LOKAJÍČEK, T. Kinetics of the Cracks Creation in Granite Under Ramp Loading. NDT Welding Bulletin, 2002, roč. 2002, č. 2, s. 17 ( s.)ISSN: 1213- 3825.
    Detail

    PAVELKA, J.; ŠIKULA, J.; VAŠINA, P.; SEDLÁKOVÁ, V.; TACANO, M.; HASHIGUCHI, S. Noise and transport characterisation of tantalum capacitors. Microelectronics Reliability, 2002, roč. 42, č. 6, s. 841 ( s.)ISSN: 0026- 2714.
    Detail

  • 2001

    SEDLÁKOVÁ, V. Noise Spectroscopy of Thick Film Resistors. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. s. 117 ( s.)ISBN: 80-214-1992- X.
    Detail

    ŠIKULA, J., PAVELKA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. The Tantalum Capacitor as a MIS Structure in Reverse Mode. In Proceedings of 21st Capacitor and Resistor technology Symposium CARTS US 2001. Huntsville, Alabama, USA: Components Technology Institute, Inc., 2001. s. 289 ( s.)ISBN: 0887- 7491.
    Detail

    PAVELKA, J., KOKTAVÝ, P., SEDLÁKOVÁ, V. Acoustic Emission Generated by Partial Discharges in Insulating Materials. In Proceedings of 31st International Conference Defektoskopie 2001. Praha: Česká společnost pro nedestruktivní testování, 2001. s. 215 ( s.)ISBN: 80-214-2002- 2.
    Detail

    SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J. Acoustic emission and partial discharges in M-I- M capacitors. In Proceedings of NDT in Progress. Třešť: DGZfP a ČNDT, 2001. s. 291 ( s.)ISBN: 80-238-7263- X.
    Detail

    ŠIKULA, J., HLÁVKA, J., PAVELKA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Tantalum Capacitors. In Proceedings of CARTS- Euro 2001. Kodaň, Dánsko: Electronic Components Institute Internationale Ltd., 2001. s. 81 ( s.)
    Detail

    ŠIKULA, J., SEDLÁKOVÁ, V., KOKTAVÝ, P., PAVELKA, J., MAJZNER, J. Electromagnetic and acoustic emission in solids. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. s. 123 ( s.)ISBN: 80-214-1992- X.
    Detail

    PAVELKA, J., ŠIKULA, J., SEDLÁKOVÁ, V., GRMELA, L., TACANO, M., HASHIGUCHI, S. Low Frequency Noise of Thin Ta2O5 Amorphous Films. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. s. 91 ( s.)ISBN: 981-02-4677- 3.
    Detail

    SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D. Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/ f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. s. 747 ( s.)ISBN: 981-02-4677- 3.
    Detail

  • 2000

    ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; KOKTAVÝ, P.; SEDLÁKOVÁ, V.; LOKAJÍČEK, T.; TACANO, M.; HASHIGUCHI, S. Cracks Detection by Electromagnetic and Acoustic Emission. In Proc. of the 15th World Conf. on Non-Destructive Testing WCNDT, October 15-21, Rome, Italy, (2000). 2000. s. 397-400.
    Detail

  • 1999

    ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; SEDLÁKOVÁ, V.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Charge transport and noise sources in thick conducting films. In Proceedings of 13th European Passive Components Symposium CARTS-Europe ' 99. UK: Electronic Components Institute Internationale Ltd., 1999. s. 163 ( s.)
    Detail

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