Ing.

Jiří Hofman

FEKT, UMEL

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Ing. Jiří Hofman

Publikace

  • 2019

    HÁZE, J.; HOFMAN, J. A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics. Journal of Electrical Engineering, 2019, roč. 70, č. 3, s. 227-235. ISSN: 1335-3632.
    Detail | WWW

  • 2017

    HOFMAN, J.; HÁZE, J.; SHARP, R. New techniques for Radiation testing of CubeSats. 2017.
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    HOFMAN, J.; HÁZE, J.; SHARP, R. A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs. 2017.
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    HOFMAN, J.; HÁZE, J.; SHARP, R. TID in-situ measurement of temperature coefficient of various commercial voltage references. In Radecs 2017 proceedings. IEEE, 2017. s. 1-4. ISBN: 9781509002337.
    Detail | WWW

  • 2016

    HOFMAN, J.; HÁZE, J.; SHARP, R.; JAKSIC, A.; VASOVIC, N. In-situ measurement of total ionising dose induced changes in threshold voltage and temperature coefficients of RADFETs. In Radiation Effects Data Workshop (REDW), 2016 IEEE. Portland, US: IEEE, 2016. s. 1-4. ISBN: 978-1-4673-2730-5.
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    HOFMAN, J.; HÁZE, J.; SHARP, R. In-situ measurement of total ionising dose induced degradation of various commercial voltage references. In Proccedings, RADECS 2017. 2016. s. 1-4. ISBN: 9781457705854.
    Detail | WWW

    HOFMAN, J.; HÁZE, J.; JAKSIC, A.; SHARP, R.; VASOVIC, N. In-situ measurement of total ionising dose induced changes in threshold voltage and temperature coefficients of RADFETs. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, roč. PP, č. 99, s. 1-5. ISSN: 0018-9499.
    Detail | WWW

  • 2015

    Jiri Hofman. A method for measuring the effect of total ionising dose on temperature coefficients of semiconductor devices. 2015. s. 1-26.
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    HOFMAN, J.; HÁZE, J.; SHARP, R.; HOLMES-SIEDLE, A. A Method for In-Situ, Total Ionising Dose Measurement of Temperature Coefficients of Semiconductor Device Parameters. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, roč. 62, č. 6, s. 2525-2531. ISSN: 0018-9499.
    Detail | WWW

  • 2014

    MOJROVÁ, B.; BAŘINKOVÁ, P.; BOUŠEK, J.; HÉGR, O.; BAŘINKA, R.; HOFMAN, J. Scanning Probe Microscopy in Technology of Solar Cells Production. ElectroScope - http://www.electroscope.zcu. cz, 2014, roč. 2014, č. 3, s. 1-6. ISSN: 1802- 4564.
    Detail | WWW

    MOJROVÁ, B.; BOUŠEK, J.; HOFMAN, J.; HÉGR, O.; BAŘINKA, R.; BAŘINKOVÁ, P. Optimization of Surface Texturing in the Solar Cells Production. In EDS 14 Imaps Cs International Conference Proceedings. Vysoké učení technické v Brně, 2014. s. 11-14. ISBN: 978-80-214-4985- 5.
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  • 2013

    HOFMAN, J. In-situ, low dose rate, TID test of the power supply block of RadEx, a CubeSat class radiation experiment module. In Radiation Effects Data Workshop (REDW), 2013 IEEE. San Francisco, CA: IEEE, 2013. s. 1-4. ISBN: 978-1-4799-1136- 3.
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    HOFMAN, J. In-situ, low dose rate, total ionising dose test of the cooling performance of a thermoelectric module. In Procceding of RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS. EUROPEAN CONFERENCE. 14TH 2013. (RADECS 2013). Oxford, UK: IEEE, 2013. s. 1-4. ISBN: 9781467350556.
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  • 2012

    HOFMAN, J.; SHARP, R. Measurement methods for total ionising dose testing: in- situ versus standard practice. In Radiation Effects Data Workshop (REDW), 2012 IEEE. Miami, FL, USA: IEEE, 2012. s. 1-4. ISBN: 978-1-4673-2730- 5.
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    HOFMAN, J. In-situ system level TID test of RadEx, a CubeSat class radiation experiment module. In Proceedings, 13th European Conference on Radiation and its Effects on Components and Systems (RADECS 2012) : Biarritz, France, September 24-28, 2012. Biarritz, France: IEEE Nuclear and Plasma Sciences Society, 2012. s. 1-4. ISBN: 978-1-4799-1136- 3.
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    HOFMAN, J. PilsenCUBE RadEx – a radiation experiment on-board a CubeSat, focused on total dose effects on precise analogue and mixed- signal devices. 2012. s. 1-11.
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    HOFMAN, J. Test methods for total dose degradation of high precision AD converters. 2012. s. 1-20.
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  • 2011

    Jiri Hofman, Richard Sharp. A total ionising dose, in- situ test campaign of DS18B20 temperature sensors. In Proceedings, 12th European Conference on Radiation and its Effects on Components and Systems (RADECS 2011) : Sevilla, Spain, September 19-23, 2011. 2011. s. 1-6. ISBN: 9781457705854.
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    VANĚK, J.; HOFMAN, J. Active Load for the Testing of Solar Modules. ECS Transactions, 2011, roč. 32, č. 1, s. 129-134. ISSN: 1938- 5862.
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    HOFMAN, J.; VANĚK, J. Aktivní zátěž pro testování fotovoltaických panelů. In 31. NEKONVENČNÍ ZDROJE ELEKTRICKÉ ENERGIE. Býkovice: Česká elektrotechnická společnost, 2011. s. 158-160. ISBN: 978-80-02-02243- 5.
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    SHARP, R.; HOFMAN, J.; HOLMES-SIEDLE, A. Using RADFETs for alpha radiation dosimetry. In Proceedings, 12th European Conference on Radiation and its Effects on Components and Systems (RADECS 2011) : Sevilla, Spain, September 19-23, 2011. Sevilla, Spain: IEEE, 2011. s. 1-4. ISBN: 9781457705854.
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  • 2010

    HOFMAN, J.; VANĚK, J. Possibility of Solar Module Testing by the Active Load. In Sborník příspěvků z 5. České fotovoltaické konference. Brno: Czech RE Agency, 2010. s. 87-89. ISBN: 978-80-254-8906- 2.
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    HOFMAN, J.; VANĚK, J. Active load for the solar module testing. In Electronic Devices and Systems. První. Brno: NOVPRESS s.r.o., 2010. s. 106-109. ISBN: 978-80-214-4138- 5.
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    HOFMAN, J.; VANĚK, J.; DOLENSKÝ, J. Maximum power point load for the solar module test. Electronics, 2010, roč. 2010, č. 4, s. 165-167. ISSN: 1313- 1842.
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    HOFMAN, J.; VANĚK, J. Active load for the testing of solar modules. In Advanced Batteries, Accumulators and Fuel Cells. Brno: Tribun EU s.r.o., 2010. s. 163-166. ISBN: 978-80-214-4148- 4.
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*) Citace publikací se generují jednou za 24 hodin.