Course detail

Advanced Methods of Electron Microscopy

FSI-9MEMAcad. year: 2020/2021

The interaction of electrons with solids are briefly reviewed with the emphasis given to elastically and inelastically scattered electrons and the origin of characteristic X-rays, which are used for chemical analysis in electron microscopy. The physical origin of image diffraction and phase contrasts in the transmission electron microscope are discussed. Special attention is paid to the formation of Kikuchi line diffraction patterns. In scanning electron microscopy, Kikuchi lines are used for all orientation imaging techniques (OIM /EBSD) which allow us to determine the orientation of grains and to establish the presence of textures. In the case of transmission electron microscopy, Kikuchi line diffraction patterns are used as crystallographic maps which allow to orient single crystals. It will be explained how simple two beam diffraction contrasts can be obtained and a brief introduction into stereographic 3D methods in scanning and transmission electron microscopy will be given. The students will practice all the theoretical concepts themselves by performing exercises at a modern electron microscope.

Learning outcomes of the course unit

Practical skills with advanced methods of materials analyses by using transmission microscope techniques.

Prerequisites

Materials analysis methods - basic course

Co-requisites

Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

David B. Williams, C. Barry Carter: Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol set) 2nd Edition, Plenum Press, New York, 1996, ISBN-13: 978-0387765020. (EN)
Hirsch, P., Howie, A., Nicholson, R.B., Pashley, D.W. and Whelan, M.J. Electron Microscopy of Thin Crystals. Krieger, New York, 1977. (EN)

Planned learning activities and teaching methods

Summer school of electron microscopy - seminar combined with practical exercises

Assesment methods and criteria linked to learning outcomes

Pass out the Summer school, test of practical microscope operation.
Practical skills of the microscope operation and interpretation of EM images

Language of instruction

Czech

Work placements

Not applicable.

Aims

Theoretical background mastering and generation of experimentla skills from direct works and analytical methods applied with advanced electron microscopes.

Specification of controlled education, way of implementation and compensation for absences

Lectures and practical excercises at transmission microscopes. Summer school of electron microscopy - seminar combined with practical exercises

Classification of course in study plans

  • Programme D-MAT-P Doctoral, 1. year of study, winter semester, 0 credits, recommended

Type of course unit

 

Lecture

20 hours, optionally

Teacher / Lecturer

Syllabus

1. The interaction of electrons with solids with the emphasis given to elastically and inelastically scattered electrons and the origin of characteristic X-rays.
2. The physical origin of image diffraction and phase contrasts in the transmission electron microscope.
3. Kikuchi line diffraction patterns formation. Kikuchi lines are used for all orientation imaging techniques (OIM /EBSD) in SEM which allow to determine the orientation of grains and to establish the presence of textures. In the case of TEM, Kikuchi line diffraction patterns are used as crystallographic maps which allow to orient single crystals.
4. Simple two beam diffraction contrasts obtaining
5. Brief introduction into stereographic 3D methods in scanning and transmission electron microscopy will be given.
The students will practice all the theoretical concepts themselves by performing exercises at a modern electron microscope.